ESPI based on spatial fringe analysis method using only two sheets of speckle patterns

Speckle interferometry based on spatial fringe analysis method using only two speckle patterns

10.1117/12.975753 ◽

2012 ◽

Author(s):

Yasuhiko Arai ◽

Takuya Inoue ◽

Shunsuke Yokozeki

Keyword(s):

Speckle Interferometry ◽

Analysis Method ◽

Fringe Analysis ◽

Speckle Patterns

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Improvement of measuring accuracy of spatial fringe analysis method using only two speckle patterns in electronic speckle pattern interferometry

Optical Engineering ◽

10.1117/1.oe.53.3.034107 ◽

2014 ◽

Vol 53 (3) ◽

pp. 034107 ◽

Cited By ~ 16

Author(s):

Yasuhiko Arai

Keyword(s):

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Analysis Method ◽

Fringe Analysis ◽

Measuring Accuracy ◽

Speckle Patterns

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Fringe analysis method for electronic speckle pattern interferometry using only speckle patterns before and after deformation

Journal of Modern Optics ◽

10.1080/09500340.2013.832817 ◽

2013 ◽

Vol 60 (15) ◽

pp. 1223-1228 ◽

Cited By ~ 1

Author(s):

Yasuhiko Arai

Keyword(s):

Speckle Pattern ◽

Electronic Speckle Pattern Interferometry ◽

Analysis Method ◽

Fringe Analysis ◽

Before And After ◽

Speckle Patterns

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Orthogonal projection technique for resolution enhancement of the Fourier transform fringe analysis method

Optics Communications ◽

10.1016/j.optcom.2006.05.020 ◽

2006 ◽

Vol 266 (2) ◽

pp. 465-468 ◽

Cited By ~ 15

Author(s):

Paulo J. Tavares ◽

Mário A. Vaz

Keyword(s):

Fourier Transform ◽

Orthogonal Projection ◽

Resolution Enhancement ◽

Analysis Method ◽

Projection Technique ◽

Fringe Analysis ◽

The Fourier Transform

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Electric speckle pattern interferometry based on spatial fringe analysis method using multicamera

10.1117/12.695287 ◽

2006 ◽

Cited By ~ 2

Author(s):

Yasuhiko Arai ◽

Shunsuke Yokozeki

Keyword(s):

Speckle Pattern ◽

Analysis Method ◽

Fringe Analysis

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In-plane displacement measurement using electronic-speckle-pattern-interferometry-based on spatial fringe analysis method

Optical Engineering ◽

10.1117/1.1778731 ◽

2004 ◽

Vol 43 (9) ◽

pp. 2168 ◽

Cited By ~ 32

Author(s):

Shunsuke Yokozeki

Keyword(s):

Speckle Pattern ◽

Displacement Measurement ◽

Electronic Speckle Pattern Interferometry ◽

Analysis Method ◽

Fringe Analysis ◽

Plane Displacement

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High-speed fringe analysis method using frequency demodulation technology

10.1117/12.195903 ◽

1994 ◽

Author(s):

Yasuhiko Arai ◽

Shunsuke Yokozeki ◽

Tomoharu Yamada

Keyword(s):

High Speed ◽

Analysis Method ◽

Fringe Analysis ◽

Frequency Demodulation

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Improvement of measuring accuracy of spatial fringe analysis method using a Kalman filter and its application

Optical Engineering ◽

10.1117/1.1410103 ◽

2001 ◽

Vol 40 (11) ◽

pp. 2605 ◽

Cited By ~ 9

Author(s):

Shunsuke Yokozeki

Keyword(s):

Kalman Filter ◽

Analysis Method ◽

Fringe Analysis ◽

Measuring Accuracy

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Single image orthogonal fringe technique for resolution enhancement of the Fourier transform fringe analysis method

Optics Communications ◽

10.1016/j.optcom.2012.10.026 ◽

2013 ◽

Vol 290 ◽

pp. 33-36 ◽

Cited By ~ 5

Author(s):

Paulo J. Tavares ◽

Mário A.P. Vaz

Keyword(s):

Fourier Transform ◽

Resolution Enhancement ◽

Analysis Method ◽

Single Image ◽

Fringe Analysis ◽

The Fourier Transform

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Fast fringe analysis method using graphics processing unit acceleration for dynamic fault identification

Optics and Photonics for Advanced Dimensional Metrology ◽

10.1117/12.2555301 ◽

2020 ◽

Author(s):

Ankur Vishnoi ◽

Rajshekhar Gannavarpu

Keyword(s):

Graphics Processing Unit ◽

Fault Identification ◽

Processing Unit ◽

Analysis Method ◽

Fringe Analysis ◽

Graphics Processing

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