Emulation of forward-looking radar technology for threat detection in rough terrain environments: a scattering and imaging study

2013 ◽  
Author(s):  
DaHan Liao ◽  
Traian Dogaru
Keyword(s):  
Imaging Study ◽  
Rough Terrain ◽  
Threat Detection ◽  
Forward Looking

A novel framework for processing forward looking infrared imagery with application to buried threat detection

2013 ◽  
Author(s):  
Jordan M. Malof ◽  
Kenneth D. Morton ◽  
Leslie M. Collins ◽  
Peter A. Torrione
Keyword(s):  
Threat Detection ◽  
Infrared Imagery ◽  
Forward Looking

Real-Time Modeling of Forward-Looking Synthetic Aperture Ground Penetrating Radar Scattering From Rough Terrain

2019 ◽  
Vol 57 (5) ◽  
pp. 2754-2765 ◽  
Author(s):  
Mohammad M. Tajdini ◽  
Borja Gonzalez-Valdes ◽  
Jose A. Martinez-Lorenzo ◽  
Ann W. Morgenthaler ◽  
Carey M. Rappaport
Keyword(s):  
Real Time ◽  
Ground Penetrating Radar ◽  
Synthetic Aperture ◽  
Rough Terrain ◽  
Time Modeling ◽  
Radar Scattering ◽  
Ground Penetrating ◽  
Forward Looking

Change-based threat detection in urban environments with a forward-looking camera

2012 ◽  
Author(s):  
Kenneth Morton ◽  
Christopher Ratto ◽  
Jordan Malof ◽  
Michael Gunter ◽  
Leslie Collins ◽  
...  
Keyword(s):  
Urban Environments ◽  
Threat Detection ◽  
Forward Looking

High resolution STEM imaging study on high Tc superconductor YBa2CuaO7-x

1988 ◽  
Vol 46 ◽  
pp. 882-883
Author(s):  
H.-J. Ou ◽  
J. M. Cowley
Keyword(s):  
Crystal Structure ◽  
High Resolution ◽  
Grain Boundary ◽  
Strong Field ◽  
Imaging Study ◽  
Structure Defects ◽  
High Tc ◽  
High Tc Superconductor ◽  
Diffraction Patterns ◽  
Lattice Planes

Using the dedicate VG-HB5 STEM microscope, the crystal structure of high Tc superconductor of YBa2Cu3O7-x has been studied via high resolution STEM (HRSTEM) imaging and nanobeam (∽3A) diffraction patterns. Figure 1(a) and 2(a) illustrate the HRSTEM image taken at 10' times magnification along [001] direction and [100] direction, respectively. In figure 1(a), a grain boundary with strong field contrast is seen between two crystal regions A and B. The grain boundary appears to be parallel to a (110) plane, although it is not possible to determine [100] and [001] axes as it is in other regions which contain twin planes [3]. Following the horizontal lattice lines, from left to right across the grain boundary, a lattice bending of ∽4° is noticed. Three extra lattice planes, indicated by arrows, were found to terminate at the grain boundary and form dislocations. It is believed that due to different chemical composition, such structure defects occur during crystal growth. No bending is observed along the vertical lattice lines.

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