Visual detection of subsurface defects using enhanced magneto-optic imaging system

2013 ◽  
Author(s):  
Yu Hua H. Cheng ◽  
Xingmake Liu ◽  
Gui Y. Tian ◽  
Libing Bai
Keyword(s):  
Visual Detection ◽  
Imaging System ◽  
Magneto Optic ◽  
Subsurface Defects

Magneto-Optic Microscope Technology for Nondestructive Testing

2013 ◽  
Vol 330 ◽  
pp. 291-298 ◽  
Author(s):  
Yu Hua Cheng ◽  
Xing Make Liu ◽  
Li Bing Bai ◽  
Gui Yun Tian
Keyword(s):  
Nondestructive Testing ◽  
Imaging System ◽  
Internal State ◽  
Testing Methods ◽  
Magneto Optic ◽  
Subsurface Defects

Nondestructive testing (NDT) is becoming more and more important nowadays, visual nondestructive testing (VNDT) such as imaging instead of traditional testing methods becomes popular and highly demanded, which makes it possible to see the internal state of objects visually. The magneto-optic (MO) microscope technology for nondestructive testing is detailedly introduced in this paper, include two different MO imaging system to test the buried subsurface defects in metallic and magnetic specimens.

The Error Analysis about Gauge Visual Detection System between High Signals and Contact Net

2012 ◽  
Vol 522 ◽  
pp. 347-350
Author(s):  
Xi Lin Zhu ◽  
Yong Yu ◽  
Qiang Wei ◽  
Xiang Zou ◽  
Chen Jun Huang
Keyword(s):  
Image Processing ◽  
Error Analysis ◽  
System Design ◽  
Visual Detection ◽  
Imaging System ◽  
Detection System ◽  
Systematic Errors ◽  
Lighting Conditions ◽  
Specific Impact

t is need to experiment to verify the correctness and validity of various stages in system design after gauge visual detection system designing between high signals and contact net. Then it does error analysis from lighting conditions, camera resolution, binocular imaging system installation structure, camera out of synchronized, noise and subsequent image processing operations, etc. It analysis the systematic errors principle and specific impact, then identifies specific improvements.

scholarly journals Detection and Diagnosis of Defect in GIS Based on X-ray Digital Imaging Technology

Energies ◽  
2020 ◽  
Vol 13 (3) ◽  
pp. 661 ◽  
Author(s):  
Tianhui Li ◽  
Xianhai Pang ◽  
Boyan Jia ◽  
Yanwei Xia ◽  
Siming Zeng ◽  
...  
Keyword(s):  
Digital Imaging ◽  
Visual Detection ◽  
Imaging System ◽  
Imaging Technique ◽  
Computed Radiography ◽  
Tube Voltage ◽  
Imaging Technology ◽  
X Ray ◽  
Digital Imaging Technology ◽  
Detection And Diagnosis

For better application of X-ray digital imaging technology in defect detection in Gas Insulated Switchgear (GIS), it is essential to investigate the typical defect and establish the defect database, which has not been adequately performed in previous work. Systematic experimental research is also needed to accumulate data and experience. In this research, an experimental platform, including Computed Radiography (CR) imaging system and a GIS model, is built, and extensive tests of different kinds of typical defects are studied. The influence X-ray irradiation on SF6 under different tube voltage levels is firstly examined, which proves that the withstand voltage of SF6 gas has not been affected and no dissociation has been found. Then, several kinds of defects are tested by X-ray digital imaging technology. The successful application examples of “visual” detection of defects further prove the practicability and validity of the X-ray digital imaging technique. Finally, the image database of typical defects inside of GIS is established and the defect risk is also analyzed in three levels, which would be useful for the defect severity diagnosis and risk assessment.

Enhanced magneto-optic imaging system for nondestructive evaluation

2007 ◽  
Vol 40 (5) ◽  
pp. 374-377 ◽  
Author(s):  
Yu Hua Cheng ◽  
Zhao Fei Zhou ◽  
Gui Yun Tian
Keyword(s):  
Nondestructive Evaluation ◽  
Imaging System ◽  
Magneto Optic

Magneto-optic microscope for visually detecting subsurface defects

2008 ◽  
Vol 47 (19) ◽  
pp. 3463 ◽  
Author(s):  
Zhao-Fei Zhou ◽  
Yu-hua Cheng
Keyword(s):  
Magneto Optic ◽  
Subsurface Defects

scholarly journals All-in-one dual CRISPR-Cas12a (AIOD-CRISPR) assay protocol for SARS-CoV-2 detection

2020 ◽  
Author(s):  
Xiong Ding ◽  
Kun Yin ◽  
Ziyue Li ◽  
Rajesh V. Lalla ◽  
Maroun M. Sfeir ◽  
...  
Keyword(s):  
Sample Preparation ◽  
Fluorescence Detection ◽  
Visual Detection ◽  
Imaging System ◽  
Point Of Care ◽  
Acid Extraction ◽  
Nucleic Acid Extraction ◽  
One Pot ◽  
Reaction Systems ◽  
Assay Protocol

Abstract This protocol presents the all-in-one dual CRISPR-Cas12a (AIOD-CRISPR) assay to ultra-sensitively and visually detect SARS-CoV-2. The procedure of AIOD-CRISPR assay typically consists of three parts including sample preparation, AIOD-CRISPR reaction, and fluorescence detection. Sample preparation involves the synthetic RNA preparation and the nucleic acid extraction from SARS-CoV-2 samples. The prepared nucleic acids were then added into the AIOD-CRISPR reaction systems as templates, followed by incubation at 37°C for 20-40 min. After incubation, visual detection was immediately conducted by placing the tubes in a portable LED blue transilluminator (Maestrogen UltraSlim) or the ChemiDoc™ MP Imaging System (Bio-Rad) with its built-in UV channel. In addition to endpoint visual detection, real-time fluorescence detection was also available for AIOD-CRISPR assay. This protocol is helpful for applying AIOD-CRISPR assay to rapid, sensitive, one-pot point-of-care SARS-CoV-2 detection.

New Aspects in the Design of Electron Optical Magnification Systems

1972 ◽  
Vol 30 ◽  
pp. 606-607
Author(s):  
Willem H.J. Andersen
Keyword(s):  
Electron Microscope ◽  
Imaging System ◽  
Chromatic Aberration ◽  
Research Tool ◽  
Energy Losses ◽  
Objective Lens ◽  
Theoretical Limit ◽  
Optical Magnification ◽  
Chromatic Aberrations ◽  
High Degree

Electron microscope design, and particularly the design of the imaging system, has reached a high degree of perfection. Present objective lenses perform up to their theoretical limit, while the whole imaging system, consisting of three or four lenses, provides very wide ranges of magnification and diffraction camera length with virtually no distortion of the image. Evolution of the electron microscope in to a routine research tool in which objects of steadily increasing thickness are investigated, has made it necessary for the designer to pay special attention to the chromatic aberrations of the magnification system (as distinct from the chromatic aberration of the objective lens). These chromatic aberrations cause edge un-sharpness of the image due to electrons which have suffered energy losses in the object.There exist two kinds of chromatic aberration of the magnification system; the chromatic change of magnification, characterized by the coefficient Cm, and the chromatic change of rotation given by Cp.

Some Quantification Problems in Parallel EELS Images

1990 ◽  
Vol 48 (2) ◽  
pp. 36-37
Author(s):  
G. Botton ◽  
G. L’Espérance ◽  
M.D. Ball ◽  
C.E. Gallerneault
Keyword(s):  
Electron Microscope ◽  
Imaging System ◽  
Signal To Noise Ratio ◽  
Scanning Transmission Electron Microscope ◽  
Acquisition Time ◽  
Thickness Variation ◽  
Transmission Electron ◽  
Distribution Of Elements ◽  
Scanning Transmission ◽  
Present Distribution

The recently developed parallel electron energy loss spectrometers (PEELS) have led to a significant reduction in spectrum acquisition time making EELS more useful in many applications in material science. Dwell times as short as 50 msec per spectrum with a PEELS coupled to a scanning transmission electron microscope (STEM), can make quantitative EEL images accessible. These images would present distribution of elements with the high spatial resolution inherent to EELS. The aim of this paper is to briefly investigate the effect of acquisition time per pixel on the signal to noise ratio (SNR), the effect of thickness variation and crystallography and finally the energy stability of spectra when acquired in the scanning mode during long periods of time.The configuration of the imaging system is the following: a Gatan PEELS is coupled to a CM30 (TEM/STEM) electron microscope, the control of the spectrometer and microscope is performed through a LINK AN10-85S MCA which is interfaced to a IBM RT 125 (running under AIX) via a DR11W line.

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