High-performance optical disk mass storage for aerospace imaging systems

1990 ◽  
Author(s):  
Stephen M. Ravner ◽  
Thomas A. Shull
Keyword(s):  
High Performance ◽  
Optical Disk ◽  
Imaging Systems ◽  
Mass Storage ◽  
Disk Mass

The bright future of digital imaging in scanning electron microscopy

1993 ◽  
Vol 51 ◽  
pp. 768-769
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Digital Imaging ◽  
High Speed ◽  
High Performance ◽  
Mass Storage ◽  
Analog To Digital ◽  
Central Processing ◽  
Digital Imaging Technology ◽  
Scanning Electron

One of the major advancements applied to scanning electron microscopy (SEM) during the past 10 years has been the development and application of digital imaging technology. Advancements in technology, notably the availability of less expensive, high-density memory chips and the development of high speed analog-to-digital converters, mass storage and high performance central processing units have fostered this revolution. Today, most modern SEM instruments have digital electronics as a standard feature. These instruments, generally have 8 bit or 256 gray levels with, at least, 512 × 512 pixel density operating at TV rate. In addition, current slow-scan commercial frame-grabber cards, directly applicable to the SEM, can have upwards of 12-14 bit lateral resolution permitting image acquisition at 4096 × 4096 resolution or greater. The two major categories of SEM systems to which digital technology have been applied are:In the analog SEM system the scan generator is normally operated in an analog manner and the image is displayed in an analog or "slow scan" mode.

High Performance Magneto-Optical Disk Using A New Plastic Substrate

1988 ◽  
Author(s):  
Toshio Niihara ◽  
Shinkichi Horigome ◽  
Ryoichi Sudou ◽  
Hiroyuki Suzuki ◽  
Masafumi Yoshihiro ◽  
...  
Keyword(s):  
High Performance ◽  
Optical Disk ◽  
Plastic Substrate

Progress toward high-performance infrared imaging systems-on-a-chip

2000 ◽  
Author(s):  
Lester J. Kozlowski ◽  
Kadri Vural ◽  
William E. Tennant ◽  
William E. Kleinhans ◽  
Isoris S. Gergis
Keyword(s):  
High Performance ◽  
Infrared Imaging ◽  
Imaging Systems

A HIGH-PERFORMANCE MIXED-TECHNOLOGY LAN FOR EDUCATION AND RESEARCH

2001 ◽  
Vol 12 (04) ◽  
pp. 459-467
Author(s):  
CLAUDIO D. ARLANDINI ◽  
MATTEO J. BOSCHINI ◽  
ANDREA MATTASOGLIO
Keyword(s):  
High Performance ◽  
Local Area Networks ◽  
Local Area ◽  
Full Duplex ◽  
Effective Bandwidth ◽  
Performance Tests ◽  
Mass Storage ◽  
Network Systems ◽  
High Bandwidth ◽  
University Consortium

In this work we describe a series of performance tests on different architectures of high bandwidth local area networks, contemporarily in use at C.I.L.E.A. (Inter-University Consortium for Automatic Elaboration of Lombardy) to connect multi-processor machines devoted to educational and research purposes, such as fluido-dynamic and mechanical simulations. This LAN is essentially made out of a standard FDDI ring, and an HyperFabric backbone. HyperFabric is a Hewlett-Packard high performance network system bus, with a declared maximum bandwidth of 2.5 Gbit/s full duplex per link. We present a comparison, in terms of effective bandwidth, average throughput and CPU consumption of the above mentioned network systems. Furthermore we also describe the effects, in terms of transfer efficiency, of such a mixed environment, in which different systems co-exist and must often be cross-walked by various applications, as backups and mass storage access. Measurements and comparisons are made using Open Software tools like netperf and HetPIPE.

A High Performance Single Chip LSI for Error Correction of Optical Disk Memory

1989 ◽  
Vol 28 (S3) ◽  
pp. 315
Author(s):  
Katsumi Murai ◽  
Makoto Ichinose ◽  
Yuzuru Kuroki ◽  
Makoto Usui ◽  
Yuji Tagaki ◽  
...  
Keyword(s):  
Error Correction ◽  
High Performance ◽  
Optical Disk ◽  
Single Chip ◽  
Disk Memory

scholarly journals The Bright Future of Digital Imaging in Scanning Electron Microscopy

1994 ◽  
Vol 2 (4) ◽  
pp. 19-20 ◽  
Author(s):  
M.T. Postek ◽  
A.E. Vladar
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Digital Imaging ◽  
High Speed ◽  
High Performance ◽  
Mass Storage ◽  
Analog To Digital ◽  
Central Processing ◽  
Digital Imaging Technology ◽  
Scanning Electron

One of the major advancements applied to scanning electron microscopy (SEM) during the past 10 years has been the development and application of digital imaging technology. Advancements in technology, notably the availability of less expensive, high-density memory chips and the development of high speed analog-to-digital converters, mass storage and high performance central processing units have fostered this revolution. Today, most modern SEM instruments have digital electronics as a standard feature. These instruments, generally have 8 bit or 256 gray levels with, at least, 512 X 512 pixel density operating at TV rate. In addition, current slow-scan commercial frame-grabber cards, directly applicable to the SEM, can have upwards of 12-14 bit lateral resolution permitting image acquisition at 4096 X 4096 resolution or greater.

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