High-speed high-resolution color line scan camera for machine vision

1994 ◽  
Author(s):  
David J. Litwiller ◽  
Mike Miethig ◽  
Brian C. Doody ◽  
P. Tom Jenkins
Keyword(s):  
High Resolution ◽  
Machine Vision ◽  
High Speed ◽  
Color Line ◽  
Line Scan

High-speed high-resolution color line scan camera for machine vision

1993 ◽  
Author(s):  
David J. Litwiller ◽  
Mike Miethig ◽  
Brian C. Doody ◽  
P. Tom Jenkins
Keyword(s):  
High Resolution ◽  
Machine Vision ◽  
High Speed ◽  
Color Line ◽  
Line Scan

High resolution RGB color line scan camera

1998 ◽  
Author(s):  
Theodore E. Lynch ◽  
Fred Huettig
Keyword(s):  
High Resolution ◽  
Color Line ◽  
Line Scan

Method of Image Correction for Color Line-Scan Machine Vision System

2013 ◽  
Vol 33 (7) ◽  
pp. 0715002
Author(s):  
陈镇龙 Chen Zhenlong ◽  
叶玉堂 Ye Yutang ◽  
宋昀岑 Song Yuncen ◽  
罗颖 Luo Ying ◽  
刘霖 Liu Lin ◽  
...  
Keyword(s):  
Machine Vision ◽  
Vision System ◽  
Machine Vision System ◽  
Image Correction ◽  
Color Line ◽  
Line Scan

Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated Circuits

1999 ◽  
Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges
Keyword(s):  
High Resolution ◽  
Integrated Circuits ◽  
Real Time ◽  
High Speed ◽  
Time Signal ◽  
Surface Imaging ◽  
Atomic Force ◽  
Submicron Structures ◽  
High Resolution Images ◽  
Capacitive Loading

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.

High-speed high-resolution CMOS voltage comparator

1986 ◽  
Vol 22 (6) ◽  
pp. 338 ◽  
Author(s):  
W.T. Ng ◽  
C.A.T. Salama
Keyword(s):  
High Resolution ◽  
High Speed ◽  
Voltage Comparator

A High Speed, High Resolution Remote MCA

1985 ◽  
Vol 32 (1) ◽  
pp. 100-104
Author(s):  
D. J. Roberts ◽  
J. J. Gregorio
Keyword(s):  
High Resolution ◽  
High Speed
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