Optical/digital system for measurements and diagnostics of surface properties of materials for micro- and optoelectronics

1994 ◽  
Author(s):  
Roman S. Bachevsky ◽  
Volodymyr A. Dostojny ◽  
Leonid I. Muravsky ◽  
Arkadiy I. Stefansky ◽  
Yurij V. Naidich ◽  
...  
Keyword(s):  
Surface Properties ◽  
Digital System ◽  
Properties Of Materials

scholarly journals Recruiting physisorbed water in surface polymerization for bio-inspired materials of tunable hydrophobicity

2016 ◽  
Vol 4 (38) ◽  
pp. 14729-14738 ◽  
Author(s):  
S. Oyola-Reynoso ◽  
I. D. Tevis ◽  
J. Chen ◽  
B. S. Chang ◽  
S. Çinar ◽  
...  
Keyword(s):  
Surface Energy ◽  
Surface Properties ◽  
Surface Polymerization ◽  
Physisorbed Water ◽  
Chemical Grafting ◽  
Properties Of Materials

Chemical grafting has been widely used to modify the surface properties of materials, especially surface energy for controlled wetting, because of the resilience of such coatings/modifications.

Using Atomic Force Microscopy to Retrieve Nanomechanical Surface Properties of Materials

2006 ◽  
Vol 514-516 ◽  
pp. 1598-1602 ◽  
Author(s):  
Sergio Graça ◽  
Rogerio Colaço ◽  
Rui Vilar
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Application Rate ◽  
Critical Parameters ◽  
Nanomechanical Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Properties Of Materials ◽  
Microscopy Techniques ◽  
Scratch Tests

When atomic force microscopy is used to retrieve nanomechanical surface properties of materials, unsuspected measurement and instrumentation errors may occur. In this work, some error sources are investigated and operating and correction procedures are proposed in order to maximize the accuracy of the measurements. Experiments were performed on sapphire, Ni, Co and Ni-30%Co samples. A triangular pyramidal diamond tip was used to perform indentation and scratch tests, as well as for surface visualization. It was found that nonlinearities of the z-piezo scanner, in particular the creep of the z-piezo, and errors in the determination of the real dimensions of tested areas, are critical parameters to be considered. However, it was observed that there is a critical load application rate, above which the influence of the creep of the z-piezo can be neglected. Also, it was observed that deconvolution of the tip geometry from the image of the tested area is essential to obtain accurate values of the dimensions of indentations and scratches. The application of these procedures enables minimizing the errors in nanomechanical property measurements using atomic force microscopy techniques.

scholarly journals Influence of Solvent and Substrate on Hydrophobicity of PLA Films

Polymers ◽  
2021 ◽  
Vol 13 (24) ◽  
pp. 4289
Author(s):  
Verónica Luque-Agudo ◽  
Amparo M. Gallardo-Moreno ◽  
María Luisa González-Martín
Keyword(s):  
Surface Tension ◽  
Polylactic Acid ◽  
Surface Properties ◽  
Bacterial Adhesion ◽  
Spatial Arrangement ◽  
Methyl Groups ◽  
Solvent Casting ◽  
Properties Of Materials ◽  
The Right ◽  
Influence Of Solvent

The study of the surface properties of materials is key in determining whether the material will be suitable for medical purposes. One of these properties is hydrophobicity, which is important when assessing its behavior against bacterial adhesion. In this work, we have studied the influence of the solvent (chloroform, acetone, and tetrahydrofuran) and the substrate (glass, PTFE, silicone, and Ti6Al4V) on which polylactic acid is deposited in solution to manufacture films by solvent-casting. Thus, it has been found that there are no significant differences in hydrophobicity and surface tension among the solvents evaluated, but there are significant differences with respect to the substrates: PLA films casted on silicone are hydrophobic, while those casted on the rest of the substrates are hydrophilic. This is related to the fact that the silicone interacts with the polymer modifying its spatial arrangement, exposing its methyl groups towards the interface with the air. In this way, it has been shown that, when manufacturing PLA films, it is important to choose the right surface on which to deposit them, depending on their desired function.

scholarly journals Correcting Scanning Errors in Scanning Probe Microscopes

1999 ◽  
Vol 7 (7) ◽  
pp. 10-13 ◽  
Author(s):  
Gregor Hsiao ◽  
Jezz Leckenby
Keyword(s):  
Surface Properties ◽  
Measurement Accuracy ◽  
Sample Surface ◽  
Scanning Probe ◽  
Properties Of Materials ◽  
Scanning Motion ◽  
Positional Control ◽  
Raster Pattern

Scanning probe microscopes (SPMs) are a family of instruments used for studying the surface properties of materials on a dimensional scale ranging from the atomic to the micrometer level. As depicted in Figure 1, all SPMs work by scanning a finely tipped probe in a raster pattern over the sample surface while measuring and mapping some interaction between the probe and the surface as a function of x-y position. The piezoelectric scanners used to provide the scanning motion offer very fine positional control but have certain inherent errors that, uncorrected, can distort images, introduce artifacts, and degrade measurement accuracy.

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