Proposed applications of monolithic microlens array technology to enhance IR detector performance

1994 ◽  
Author(s):  
J. P. Wilson ◽  
Patrick J. Reardon
Keyword(s):  
Microlens Array ◽  
Ir Detector ◽  
Detector Performance ◽  
Array Technology

scholarly journals Introduction

1995 ◽  
Vol 167 ◽  
pp. 3-7
Author(s):  
A. G. Davis Philip
Keyword(s):  
Large Field ◽  
Direct Imaging ◽  
Ir Detector ◽  
New Developments ◽  
Detector Arrays ◽  
Array Detectors ◽  
Poster Sessions ◽  
Array Technology ◽  
The Subject ◽  
Scientific Results

A short introduction to the subject of the meeting, IAU Symposium No. 167, New Developments in Array Technology and Applications is given. CCD and Array detectors have become the detectors of choice at optical observatories all over the world. Direct imaging, photometry and spectroscopy are all vastly improved as a result. Thirteen IAU Commissions joined in sponsoring this meeting which indicates the wide interest in this subject. In the five days of the symposium the following topics were discussed: New Developments in CCD Technology, New Developments in IR Detector Arrays, Direct Imaging with CCDs and Other Arrays, Spectroscopy with CCDs and Other Arrays and Large Field Imaging with Array Mosaics. A few papers concerning Astrometry with CCDs were given in the poster sessions. Scientific results were also presented in the poster sessions.

Heterostructures improve IR detector performance

SPIE Newsroom ◽  
2010 ◽  
Author(s):  
Stephen Myers ◽  
Elena Plis ◽  
Sanjay Krishna ◽  
Edward Smith
Keyword(s):  
Ir Detector ◽  
Detector Performance

IR detector performance in an area array

2000 ◽  
Author(s):  
Vikram Dhar ◽  
Vishnu Gopal ◽  
Vikram Kumar
Keyword(s):  
Ir Detector ◽  
Detector Performance ◽  
Area Array

High-purity Ge x-ray detectors: Sensitivity factors and usefulness

1990 ◽  
Vol 48 (2) ◽  
pp. 548-548
Author(s):  
E. B. Steel
Keyword(s):  
High Purity ◽  
High Energy ◽  
Quantitative Chemical Analysis ◽  
Detector Performance ◽  
X Ray ◽  
Detector Sensitivity ◽  
Specimen Holder ◽  
Many Instruments ◽  
Charge Resolution ◽  
Sensitivity Factors

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.

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