Proposed UV-laser-source-excited high-resolution and high-count-rate time-of-flight photoelectron energy analyzer for solid state samples

1994 ◽  
Author(s):  
Aleksander S. Aleksandrovsky ◽  
Vitaly V. Slabko
Keyword(s):  
Solid State ◽  
High Resolution ◽  
Count Rate ◽  
Time Of Flight ◽  
Laser Source ◽  
Uv Laser ◽  
Energy Analyzer ◽  
High Count ◽  
High Count Rate ◽  
Photoelectron Energy

F-9 Progress with Silicon Drift Detectors Used for High Resolution—High Count Rate X-ray Spectroscopy

2004 ◽  
Vol 19 (2) ◽  
pp. 197-197
Author(s):  
H. Soltau ◽  
P. Lechner ◽  
G. Lutz ◽  
L. Strüder ◽  
C. Fiorini ◽  
...  
Keyword(s):  
High Resolution ◽  
Count Rate ◽  
High Count ◽  
High Count Rate ◽  
X Ray ◽  
Silicon Drift Detectors

C05 Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy at Room Temperature

2003 ◽  
Vol 18 (2) ◽  
pp. 175-175 ◽  
Author(s):  
P. Lechner ◽  
H. Soltau ◽  
C. Fiorini ◽  
A. Longoni ◽  
G. Lutz ◽  
...  
Keyword(s):  
High Resolution ◽  
Count Rate ◽  
Room Temperature ◽  
High Count ◽  
High Count Rate ◽  
X Ray ◽  
Silicon Drift Detectors

F25 Optimized Readout Methods of Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy

2005 ◽  
Vol 20 (2) ◽  
pp. 185-185
Author(s):  
A. Niculae ◽  
H. Soltau ◽  
P. Lechner ◽  
G. Lutz ◽  
L. Strüder ◽  
...  
Keyword(s):  
High Resolution ◽  
Count Rate ◽  
High Count ◽  
High Count Rate ◽  
X Ray ◽  
Silicon Drift Detectors

The upgraded JET gamma-ray cameras based on high resolution/high count rate compact spectrometers

2018 ◽  
Vol 89 (10) ◽  
pp. 10I116 ◽  
Author(s):  
D. Rigamonti ◽  
A. Broslawski ◽  
A. Fernandes ◽  
J. Figueiredo ◽  
L. Giacomelli ◽  
...  
Keyword(s):  
High Resolution ◽  
Count Rate ◽  
Gamma Ray ◽  
High Count ◽  
High Count Rate

scholarly journals High Resolution Imaging and X-Ray Microanalysis at High Count Rate: The Supreme Achievement in Materials Characterization

2013 ◽  
Vol 19 (S2) ◽  
pp. 360-361 ◽  
Author(s):  
R. Gauvin ◽  
D.C. Joy ◽  
N. Brodusch ◽  
H. Demers ◽  
P. Woo
Keyword(s):  
High Resolution ◽  
Count Rate ◽  
Materials Characterization ◽  
High Resolution Imaging ◽  
High Count ◽  
High Count Rate ◽  
X Ray ◽  
Resolution Imaging

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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