X-ray photoelectron spectroscopy (XPS) studies on Zn/Cd selenide thin films grown by electron-beam deposition

1994 ◽  
Author(s):  
D. R. Rao ◽  
R. Islam
2017 ◽  
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pp. 1-4 ◽  
Author(s):  
Fred Michael Finkbeiner ◽  
Joseph S. Adams ◽  
Simon R. Bandler ◽  
Gabriele L. Betancourt-Martinez ◽  
Ari David Brown ◽  
...  

2012 ◽  
Vol 111 (3) ◽  
pp. 975-981 ◽  
Author(s):  
R. E. Marvel ◽  
K. Appavoo ◽  
B. K. Choi ◽  
J. Nag ◽  
R. F. Haglund

1993 ◽  
Author(s):  
Olof Erlandsson ◽  
Johannes Lindvall ◽  
Ngoc T. Nguyen ◽  
Van H. Nguyen ◽  
Thi Bich Vu ◽  
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2018 ◽  
Vol 15 (7) ◽  
pp. 1700239 ◽  
Author(s):  
Roman Jędrzejewski ◽  
Joanna Piwowarczyk ◽  
Anna Jędrzejewska ◽  
Konrad Kwiatkowski ◽  
Jolanta Baranowska

2009 ◽  
Vol 36 (8) ◽  
pp. 2166-2170
Author(s):  
肖秀娣 Xiao Xiudi ◽  
董国平 Dong Guoping ◽  
邓淞文 Deng Songwen ◽  
邵建达 Shao Jianda ◽  
范正修 Fan Zhengxiu

2014 ◽  
Vol 41 (10) ◽  
pp. 1007002
Author(s):  
杜倩倩 Du Qianqian ◽  
王文军 Wang Wenjun ◽  
李淑红 Li Shuhong ◽  
刘云龙 Liu Yunlong ◽  
和晓晓 He Xiaoxiao ◽  
...  

1996 ◽  
Vol 19 (6) ◽  
pp. 1109-1116 ◽  
Author(s):  
G S Lodha ◽  
R V Nandedkar ◽  
Adu Varma

2004 ◽  
Vol 03 (04n05) ◽  
pp. 631-638 ◽  
Author(s):  
S. JAIN ◽  
S. Y. CHAN ◽  
A. O. ADEYEYE ◽  
C. B. BOOTHROYD

A new technique for synthesizing Fe nanoparticles based on an electron beam deposition technique from a Fe 2 O 3 source has been developed. We deposited Fe 2 O 3 films directly on Si (001) substrates, Al and Cu buffer layer, and observed the formation of Fe nanoparticles at the Si (001) and Al interfaces respectively. The Al at the interface is oxidized to Al 2 O 3 and Si is oxidized to SiO 2. For films deposited on Cu buffer layer, however, no Fe nanoparticles were formed. We explain our results in terms of the enthalpy of formation of the oxides. The enthalpy of formation of SiO 2 and Al 2 O 3 is much lower than that of Fe 2 O 3, thus promoting the formation of Fe nanoparticles. The enthalpy of formation of CuO is however, greater than that of Fe 2 O 3 thus forbidding the formation of Fe nanoparticles. This is in agreement with both X-ray Photoelectron Spectroscopy (XPS) depth profile analysis and Transmission Electron Microscopy (TEM).


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