REGAIN: a new optical beam combiner for the G12T

1994 ◽  
Author(s):  
Denis Mourard ◽  
Alain Blazit ◽  
Daniel Bonneau ◽  
D. Merlin ◽  
Isabelle Tallon-Bosc ◽  
...  
Keyword(s):  
Optical Beam ◽  
Beam Combiner

50 Mbps optical homodyne communication receiver with a photorefractive optical beam combiner

1992 ◽  
Vol 4 (11) ◽  
pp. 1295-1298 ◽  
Author(s):  
F. Davidson ◽  
C. Field ◽  
X. Sun
Keyword(s):  
Optical Beam ◽  
Beam Combiner

scholarly journals Direct UV-Written Integrated Optical Beam Combiner for Stellar Interferometry

2007 ◽  
Vol 25 (1) ◽  
pp. 367-371 ◽  
Author(s):  
Massimo Olivero ◽  
Mikael Svalgaard ◽  
Laurent Jocou ◽  
Jean-Philippe Berger
Keyword(s):  
Optical Beam ◽  
Beam Combiner ◽  
Integrated Optical ◽  
Stellar Interferometry

scholarly journals Simulations and performance of the QUBIC optical beam combiner

2018 ◽  
Author(s):  
Créidhe O'Sullivan ◽  
David Burke ◽  
Donnacha Gayer ◽  
J.D. Murphy ◽  
E. Guerrard ◽  
...  
Keyword(s):  
Optical Beam ◽  
Beam Combiner ◽  
And Performance

A mode-evolution-type integrated-optical beam combiner for coherent receivers

1991 ◽  
Vol 3 (4) ◽  
pp. 339-341 ◽  
Author(s):  
D.A. Smith ◽  
J.E. Baran ◽  
J.L. Jackel ◽  
R.E. Wagner ◽  
R. Welter
Keyword(s):  
Optical Beam ◽  
Beam Combiner ◽  
Integrated Optical ◽  
Coherent Receivers ◽  
Evolution Type

Electromagnetically Driven 2-axis Optical Beam Steering MEMS Mirror and Its Dependence of Actuation on Magnetic Field

2010 ◽  
Vol 130 (4) ◽  
pp. 107-112 ◽  
Author(s):  
Yoshiyuki Watanabe ◽  
Yutaka Abe ◽  
Shinnosuke Iwamatsu ◽  
Seiya Kobayashi ◽  
Yoshiyuki Takahashi ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Beam Steering ◽  
Optical Beam

Comparison of Active and Passive Voltage Contrast for Failure Localization

2007 ◽  
Author(s):  
R. Rosenkranz ◽  
W. Werner
Keyword(s):  
Case Studies ◽  
Optical Beam ◽  
Leakage Currents ◽  
Localization Method ◽  
Voltage Contrast ◽  
Failure Localization

Abstract In many cases of failure localization, passive voltage contrast (PVC) localization method does not work, because it is not possible to charge up conducting structures which supposed to be dark in the SEM and FIB images. The reason for this is leakage currents. In this article, the authors show how they succeeded in overcoming these difficulties by the application of the active voltage contrast (AVC) method as it was described as biased voltage contrast by Campbell and Soden. They identified three main cases where the PVC didn't work but where they succeeded in failure localization with the AVC method. This is illustrated with the use of two case studies. Compared to the optical beam based methods the resolution is much better so a single failing contact of e.g. 70 nm technology can clearly be identified which cannot be done by TIVA or OBIRCH.

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