Generation and characterization of recombination-pumped x-ray laser plasmas

1994 ◽  
Author(s):  
Tom D. Donnelly ◽  
Thorton E. Glover ◽  
Everett A. Lipman ◽  
Alan Sullivan ◽  
Roger W. Falcone ◽  
...  
Keyword(s):  
X Ray ◽  
Laser Plasmas

X-ray characterization of picosecond laser plasmas

1987 ◽  
Vol 63 (4) ◽  
pp. 253-258 ◽  
Author(s):  
O.L. Landen ◽  
E.M. Campbell ◽  
M.D. Perry
Keyword(s):  
Picosecond Laser ◽  
X Ray ◽  
Laser Plasmas

scholarly journals Spectral characterization of double-driven x-ray laser plasmas

2003 ◽  
Vol 52 (3) ◽  
pp. 556
Author(s):  
Wang Rui-Rong ◽  
Wang Wei ◽  
Wang Chen ◽  
Dong Jia-Qin ◽  
Sun Jin-Ren ◽  
...  
Keyword(s):  
Spectral Characterization ◽  
X Ray ◽  
Laser Plasmas

X-ray characterization of picosecond laser plasmas

1987 ◽  
Author(s):  
O. L. Landen ◽  
E. M. Campbell ◽  
M. D. Perry
Keyword(s):  
Picosecond Laser ◽  
X Ray ◽  
Laser Plasmas

Characterization of a spherically bent quartz crystal for Kα x-ray imaging of laser plasmas using a focusing monochromator geometry

2011 ◽  
Vol 6 (03) ◽  
pp. T03002-T03002 ◽  
Author(s):  
N L Kugland ◽  
C G Constantin ◽  
T Döppner ◽  
P Neumayer ◽  
S H Glenzer ◽  
...  
Keyword(s):  
Quartz Crystal ◽  
X Ray ◽  
Laser Plasmas ◽  
X Ray Imaging

Spectroscopic characterization of prepulsed x-ray laser plasmas

1996 ◽  
Vol 54 (3) ◽  
pp. 2852-2862 ◽  
Author(s):  
M. Nantel ◽  
A. Klisnick ◽  
G. Jamelot ◽  
P. B. Holden ◽  
B. Rus ◽  
...  
Keyword(s):  
Spectroscopic Characterization ◽  
X Ray ◽  
Laser Plasmas

Diagnostics of Gold Laser Plasmas

1988 ◽  
Vol 102 ◽  
pp. 357-360
Author(s):  
J.C. Gauthier ◽  
J.P. Geindre ◽  
P. Monier ◽  
C. Chenais-Popovics ◽  
N. Tragin ◽  
...  
Keyword(s):  
Experimental Results ◽  
Pure Gold ◽  
Electronic Temperature ◽  
X Ray ◽  
Laser Plasmas ◽  
Collisional Radiative Model ◽  
Radiative Model

AbstractIn order to achieve a nickel-like X ray laser scheme we need a tool to determine the parameters which characterise the high-Z plasma. The aim of this work is to study gold laser plasmas and to compare experimental results to a collisional-radiative model which describes nickel-like ions. The electronic temperature and density are measured by the emission of an aluminium tracer. They are compared to the predictions of the nickel-like model for pure gold. The results show that the density and temperature can be estimated in a pure gold plasma.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

High Resolution Replication of Organoclay Surfaces

1982 ◽  
Vol 40 ◽  
pp. 576-577
Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys
Keyword(s):  
Clay Mineral ◽  
Organic Molecule ◽  
Organic Molecules ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Naturally Occurring ◽  
Silicate Layers ◽  
Mineral Identification

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.

Digital x-ray mapping of nanometer-size supported bimetallic catalysts

1988 ◽  
Vol 46 ◽  
pp. 530-531
Author(s):  
L. T. Germinario
Keyword(s):  
Background Radiation ◽  
Metal Cluster ◽  
Single Element ◽  
Beam Diameter ◽  
X Rays ◽  
X Ray ◽  
Major Interest ◽  
Induced Changes

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.

Plant Pathology Diagnosed by X-Ray Microanalysis

1987 ◽  
Vol 45 ◽  
pp. 974-975
Author(s):  
J. H. Resau ◽  
N. Howell ◽  
S. H. Chang
Keyword(s):  
Electron Microscopy ◽  
Plant Pathology ◽  
Biochemical Characterization ◽  
Nutrient Deficiency ◽  
Green Leaf ◽  
Parasitic Infestation ◽  
X Ray

Spinach grown in Texas developed “yellow spotting” on the peripheral portions of the leaves. The exact cause of the discoloration could not be determined as there was no evidence of viral or parasitic infestation of the plants and biochemical characterization of the plants did not indicate any significant differences between the yellow and green leaf portions of the spinach. The present study was undertaken using electron microscopy (EM) to determine if a micro-nutrient deficiency was the cause for the discoloration.Green leaf spinach was collected from the field and sent by express mail to the EM laboratory. The yellow and equivalent green portions of the leaves were isolated and dried in a Denton evaporator at 10-5 Torr for 24 hrs. The leaf specimens were then examined using a JEOL 100 CX analytical microscope. TEM specimens were prepared according to the methods of Trump et al.

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