Critical dimension measurement in the SEM: comparison of backscattered vs. secondary electron detection

1994 ◽  
Author(s):  
Neal T. Sullivan ◽  
Robert M. Newcomb
Keyword(s):  
Secondary Electron ◽  
Critical Dimension ◽  
Dimension Measurement ◽  
Electron Detection

scholarly journals Critical dimension measurement of transparent film layers by multispectral imaging

2014 ◽  
Vol 22 (14) ◽  
pp. 17370 ◽  
Author(s):  
Soonyang Kwon ◽  
Namyoon Kim ◽  
Taeyong Jo ◽  
Heui Jae Pahk
Keyword(s):  
Multispectral Imaging ◽  
Critical Dimension ◽  
Transparent Film ◽  
Dimension Measurement

Beam tracking with micromegas & wire chambers in secondary electron detection configuration

2013 ◽  
Vol 8 (12) ◽  
pp. C12023-C12023 ◽  
Author(s):  
M Voštinar ◽  
B Fernández ◽  
J Pancin ◽  
M A G Alvarez ◽  
T Chaminade ◽  
...  
Keyword(s):  
Secondary Electron ◽  
Electron Detection ◽  
Beam Tracking ◽  
Wire Chambers

Critical-Dimension Measurement using Multi-Angle-Scanning Method in Atomic Force Microscope

2006 ◽  
Vol 45 (7) ◽  
pp. 5928-5932 ◽  
Author(s):  
Ken Murayama ◽  
Satoshi Gonda ◽  
Hajime Koyanagi ◽  
Tsuneo Terasawa ◽  
Sumio Hosaka
Keyword(s):  
Atomic Force Microscope ◽  
Critical Dimension ◽  
Scanning Method ◽  
Atomic Force ◽  
Dimension Measurement
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