Characterization of laboratory-generated turbulence by optical phase measurements

1993 ◽  
Author(s):  
Eric P. Magee ◽  
Byron M. Welsh
Keyword(s):  
Phase Measurements ◽  
Optical Phase

BWO-Characterization of Materials and Devices at Frequencies 100-1000 GHz.

2000 ◽  
Vol 631 ◽  
Author(s):  
A. A. Volkov ◽  
V. B. Anzin ◽  
Yu. G. Goncharov ◽  
B. P. Gorshunov ◽  
G. A. Komandin ◽  
...  
Keyword(s):  
High Speed ◽  
Open Space ◽  
Frequency Tuning ◽  
High Radiation ◽  
Phase Measurements ◽  
Spectral Technique ◽  
Wide Range ◽  
Characterization Of Materials ◽  
Space Measurement

ABSTRACTWe have developed multipurpose spectral technique for amplitude and phase measurements at frequencies 100–1000 GHz based on the use of backward wave oscillators (BWOs) as sources of probing radiation. It utilizes to the utmost all the remarkable advantages of BWOs such as high radiation intensity, monochromaticity, polarization, as well as high speed and wide range of frequency tuning. Extremely simple and flexible open-space measurement geometries are used. The developed technique seems to be the most appropriate and promising for the reliable, precise and mass characterization of materials and devices at millimeter-submillimeter waves.

Optical phase measurements in red blood cells using low-coherence spectroscopy

2012 ◽  
Author(s):  
Itay Shock ◽  
Alexander Barbul ◽  
Pinhas Girshovitz ◽  
Uri Nevo ◽  
Rafi Korenstein ◽  
...  
Keyword(s):  
Red Blood Cells ◽  
Blood Cells ◽  
Phase Measurements ◽  
Optical Phase ◽  
Low Coherence ◽  
Coherence Spectroscopy

Optical Phase Characterization of Photonic Integrated Devices

2014 ◽  
Vol 20 (4) ◽  
pp. 417-421 ◽  
Author(s):  
Joaquin Matres ◽  
Guillem C. Ballesteros ◽  
Sara Mas ◽  
Antoine Brimont ◽  
Pablo Sanchis ◽  
...  
Keyword(s):  
Optical Phase ◽  
Integrated Devices ◽  
Phase Characterization

scholarly journals Characterization of quantum interference control of injected currents in LT-GaAs for carrier-envelope phase measurements

2003 ◽  
Vol 11 (17) ◽  
pp. 2081 ◽  
Author(s):  
Peter Roos ◽  
Qudsia Quraishi ◽  
Steven Cundiff ◽  
Ravi Bhat ◽  
J. Sipe
Keyword(s):  
Quantum Interference ◽  
Interference Control ◽  
Phase Measurements ◽  
Carrier Envelope Phase ◽  
Lt Gaas

Characterization of ultrafast interactions with materials through the direct measurement of the optical phase

1996 ◽  
Author(s):  
Tracy S. Clement ◽  
George Rodriguez ◽  
W. M. Wood ◽  
Antoinette J. Taylor
Keyword(s):  
Direct Measurement ◽  
Optical Phase

Two interferometric methods for the mechanical characterization of thin films by bulging tests. Application to single crystal of silicon

1997 ◽  
Vol 12 (9) ◽  
pp. 2234-2248 ◽  
Author(s):  
E. Bonnotte ◽  
P. Delobelle ◽  
L. Bornier ◽  
B. Trolard ◽  
G. Tribillon
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Mechanical Characterization ◽  
Optical Methods ◽  
Fringe Projection ◽  
Phase Measurements ◽  
Experimental Apparatus ◽  
Theory And Experiments ◽  
Good Agreement

Two optical methods are presented for the mechanical characterization of thin films, namely real time holographic interferometry and a fringe projection method called “contouring.” These two methods are coupled to the interferometry by the phase measurements, thus allowing the displacement field to be measured at all points on the membrane. We discuss the solutions retained in terms of their precision and sensitivity. These methods are then applied to membrane bulging tests, a type of test that is widely used in micro-mechanical studies. The measurements are performed on silicon single crystal and the results are compared to the solutions calculated by finite element methods. In both cases, the good agreement between theory and experiments allows the experimental apparatus to be validated.

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