New generation high-speed high-resolution hemispherical scatterometer

1993 ◽  
Author(s):  
Raymond J. Castonguay
Keyword(s):  
High Resolution ◽  
High Speed ◽  
New Generation

The Contribution of Intermediate-Voltage, High-Resolution Electron Microscopy In Materials Science: An Appraisal

1990 ◽  
Vol 48 (1) ◽  
pp. 478-479
Author(s):  
John L. Hutchison
Keyword(s):  
High Resolution ◽  
Materials Science ◽  
High Resolution Electron Microscopy ◽  
Optical Diffraction ◽  
The Past ◽  
Resolution Electron ◽  
Extreme Sensitivity ◽  
Electron Microscopes ◽  
New Generation ◽  
Small Metal Particles

Over the past five years or so the development of a new generation of high resolution electron microscopes operating routinely in the 300-400 kilovolt range has produced a dramatic increase in resolution, to around 1.6 Å for “structure resolution” and approaching 1.2 Å for information limits. With a large number of such instruments now in operation it is timely to assess their impact in the various areas of materials science where they are now being used. Are they falling short of the early expectations? Generally, the manufacturers’ claims regarding resolution are being met, but one unexpected factor which has emerged is the extreme sensitivity of these instruments to both floor-borne and acoustic vibrations. Successful measures to counteract these disturbances may require the use of special anti-vibration blocks, or even simple oil-filled dampers together with springs, with heavy curtaining around the microscope room to reduce noise levels. In assessing performance levels, optical diffraction analysis is becoming the accepted method, with rotational averaging useful for obtaining a good measure of information limits. It is worth noting here that microscope alignment becomes very critical for the highest resolution.In attempting an appraisal of the contributions of intermediate voltage HREMs to materials science we will outline a few of the areas where they are most widely used. These include semiconductors, oxides, and small metal particles, in addition to metals and minerals.

Materials for bullet core

2020 ◽  
Vol 2020 (10) ◽  
pp. 8-21
Author(s):  
A. G. Kolmakov ◽  
◽  
I. O. Bannykh ◽  
V. I. Antipov ◽  
L. V. Vinogradov ◽  
...  
Keyword(s):  
High Speed ◽  
Bending Strength ◽  
Low Alloy Steels ◽  
Hard Alloys ◽  
Small Arms ◽  
Alloy Steels ◽  
Materials Used ◽  
Basic Ideas ◽  
New Generation ◽  
Natural Composite

he basic ideas about the process of introducing cores into protective barriers and the most common core patterns and their location in conventional and sub-caliber small arms bullets are discussed. The materials used for manufacture of cores are analyzed. It is concluded that for mass bullets of increased armor penetration the most rational choice can be considered the use of high-carbon low-alloy steels of a new generation with a natural composite structure and hardness of up to 70 HRC. For specialized armor-piercing bullets, cores made from promising economically-alloyed high-speed steels characterized by a high complex of «hardness—bending strength» are better alternative than ones made of hard alloys or tungsten alloys.

Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated Circuits

1999 ◽  
Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges
Keyword(s):  
High Resolution ◽  
Integrated Circuits ◽  
Real Time ◽  
High Speed ◽  
Time Signal ◽  
Surface Imaging ◽  
Atomic Force ◽  
Submicron Structures ◽  
High Resolution Images ◽  
Capacitive Loading

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.

High-speed high-resolution CMOS voltage comparator

1986 ◽  
Vol 22 (6) ◽  
pp. 338 ◽  
Author(s):  
W.T. Ng ◽  
C.A.T. Salama
Keyword(s):  
High Resolution ◽  
High Speed ◽  
Voltage Comparator

A High Speed, High Resolution Remote MCA

1985 ◽  
Vol 32 (1) ◽  
pp. 100-104
Author(s):  
D. J. Roberts ◽  
J. J. Gregorio
Keyword(s):  
High Resolution ◽  
High Speed

scholarly journals Understanding oxide degradation mechanisms in ultra-thin SiO2 through high-speed, high-resolution in-situ measurements

2005 ◽  
Vol 80 ◽  
pp. 182-185 ◽  
Author(s):  
S. Aresu ◽  
W. De Ceuninck ◽  
R. Degraeve ◽  
B. Kaczer ◽  
G. Knuyt ◽  
...  
Keyword(s):  
High Resolution ◽  
High Speed ◽  
In Situ Measurements ◽  
Degradation Mechanisms ◽  
Oxide Degradation

Splash formation by spherical drops

2001 ◽  
Vol 427 ◽  
pp. 73-105 ◽  
Author(s):  
LIOW JONG LENG
Keyword(s):  
High Resolution ◽  
Quantitative Data ◽  
Water Surface ◽  
High Speed ◽  
Scaling Laws ◽  
Capillary Wave ◽  
Water Drop ◽  
Qualitative And Quantitative ◽  
High Resolution Images ◽  
The Impact

The impact of a spherical water drop onto a water surface has been studied experimentally with the aid of a 35 mm drum camera giving high-resolution images that provided qualitative and quantitative data on the phenomena. Scaling laws for the time to reach maximum cavity sizes have been derived and provide a good fit to the experimental results. Transitions between the regimes for coalescence-only, the formation of a high-speed jet and bubble entrapment have been delineated. The high-speed jet was found to occur without bubble entrapment. This was caused by the rapid retraction of the trough formed by a capillary wave converging to the centre of the cavity base. The converging capillary wave has a profile similar to a Crapper wave. A plot showing the different regimes of cavity and impact drop behaviour in the Weber–Froude number-plane has been constructed for Fr and We less than 1000.

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