New computer-controlled polarization phase-shifting technique

1993 ◽  
Author(s):  
G. C. Jin ◽  
Nai-Keng Bao ◽  
Po Sheun Chung
Keyword(s):  
Phase Shifting ◽  
Phase Shifting Technique ◽  
Computer Controlled ◽  
Polarization Phase

Cyclic Radial Shearing Interferometry Based on Polarization Phase-Shifting Technique

2010 ◽  
Vol 30 (1) ◽  
pp. 127-131
Author(s):  
孔梅梅 Kong Meimei ◽  
高志山 Gao Zhishan ◽  
陈磊 Chen Lei ◽  
徐春生 Xu Chunsheng
Keyword(s):  
Phase Shifting ◽  
Shearing Interferometry ◽  
Phase Shifting Technique ◽  
Polarization Phase

Effects of birefringence on Fizeau interferometry that uses a polarization phase-shifting technique

2005 ◽  
Vol 44 (35) ◽  
pp. 7548 ◽  
Author(s):  
Chunyu Zhao ◽  
Dongyel Kang ◽  
James H. Burge
Keyword(s):  
Phase Shifting ◽  
Phase Shifting Technique ◽  
Polarization Phase

scholarly journals Utilization of the cyclic interferometer in polarization phase-shifting technique to determine the thickness of transparent thin-films

2020 ◽  
Vol 50 (1) ◽  
Author(s):  
Rapeepan Kaewon ◽  
Chutchai Pawong ◽  
Ratchapak Chitaree ◽  
Tossaporn Lertvanithphol ◽  
Apichai Bhatranand
Keyword(s):  
Thin Films ◽  
Beam Splitter ◽  
Incident Light ◽  
Reference Beam ◽  
Phase Shifting ◽  
Standard Equipment ◽  
Polarized Beams ◽  
Phase Shifting Technique ◽  
Polarizing Beam Splitter ◽  
Polarization Phase

An alternative polarization phase-shifting technique is proposed to determine the thickness of transparent thin-films. In this study, the cyclic interferometric configuration is chosen to maintain the stability of the operation against external vibrations. The incident light is simply split by a non-polarizing beam splitter cube to generate test and reference beams, which are subsequently polarized by a polarizing beam splitter. Both linearly polarized beams are orthogonal and counter-propagating within the interferometer. A wave plate is inserted into the common paths to introduce an intrinsic phase difference between the orthogonal polarized beams. A transparent thin-film sample, placed in one of the beam tracks, modifies the output signal in terms of the phase retardation in comparison with the reference beam. The proposed phase-shifting technique uses a moving mirror with a set of “fixed” polarizing elements, namely, a quarter-wave retarder and a polarizer, to facilitate phase extraction without rotating any polarizing devices. The measured thicknesses are compared with the measurements of the same films acquired using standard equipment such as the field-emission scanning electron microscope and spectroscopic ellipsometer. Experimental results with the corresponding measured values are in good agreement with commercial measurements. The system can be reliably utilized for non-destructive thickness measurements of transparent thin-films.

Dynamic temperature field measurements using a polarization phase shifting technique

2014 ◽  
Author(s):  
David Ignacio Serrano-García ◽  
Amalia Martínez-García ◽  
Noel-Ivan Toto-Arellano ◽  
Yukitoshi Otani
Keyword(s):  
Temperature Field ◽  
Field Measurements ◽  
Phase Shifting ◽  
Dynamic Temperature ◽  
Phase Shifting Technique ◽  
Polarization Phase

scholarly journals Dynamic temperature field measurements using a polarization phase-shifting technique

2014 ◽  
Vol 53 (11) ◽  
pp. 112202 ◽  
Author(s):  
David Ignacio Serrano-García ◽  
Amalia Martínez-García ◽  
Noel-Ivan Toto-Arellano ◽  
Yukitoshi Otani
Keyword(s):  
Temperature Field ◽  
Field Measurements ◽  
Phase Shifting ◽  
Dynamic Temperature ◽  
Phase Shifting Technique ◽  
Polarization Phase

Self-referenced rectangular path cyclic interferometer with polarization phase shifting

2011 ◽  
Vol 51 (1) ◽  
pp. 126 ◽  
Author(s):  
S. Sarkar ◽  
N. Ghosh ◽  
S. Chakraborty ◽  
K. Bhattacharya
Keyword(s):  
Phase Shifting ◽  
Polarization Phase
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