PC-based real-time defect imaging system for high-speed web inspection

1993 ◽  
Author(s):  
James W. Roberts ◽  
S. D. Rose ◽  
Graham A. Jullien ◽  
Lee T. Nichols ◽  
P. Tom Jenkins ◽  
...  
Keyword(s):  
Real Time ◽  
High Speed ◽  
Imaging System ◽  
Web Inspection ◽  
Defect Imaging

scholarly journals 87. Real-Time Three-Dimensional Diagnostic Imaging System Using High-Speed TCT-900S CT Scanner

1990 ◽  
Vol 46 (8) ◽  
pp. 1061
Author(s):  
Tetsurou Hada ◽  
Ichirou Yamagishi ◽  
Yoshiki Hirao ◽  
Hiroshi Aradate ◽  
Hiroyuki Kura ◽  
...  
Keyword(s):  
Diagnostic Imaging ◽  
Real Time ◽  
High Speed ◽  
Imaging System ◽  
Three Dimensional ◽  
Ct Scanner

Design and Implementation of FFT Module Based on Virtex Series FPGA

2012 ◽  
Vol 241-244 ◽  
pp. 2654-2658
Author(s):  
Xu Hui Zhang ◽  
Ming Yang Wu ◽  
Hai Jun Lin ◽  
Zhen Zhen Tang
Keyword(s):  
Real Time ◽  
High Speed ◽  
Imaging System ◽  
Radar Data ◽  
Matlab Simulation ◽  
Time Data ◽  
Real Time Processing ◽  
Data Output ◽  
Stable Performance ◽  
New Generation

In order to achieve real-time data output in synthetic aperture radar (SAR) imaging system, high-speed FFT transformation is needed. In this article, we proposed the program that uses the new generation of high-speed, large-capacity Virtex series FPGA to implement radix-4 FFT algorithm and simulated it with the Modelsim software, and then through the comparative analysis of simulation results by MATLAB. After analyzing the results compared with MATLAB simulation, it shows that FFT module has stable performance, fast operation and fully meets the radar data real-time processing requirements.

High speed interferometric device for real-time correction of aero-optic effects

1995 ◽  
Author(s):  
Rod Clark ◽  
John Karpinsky ◽  
Gregg Borek ◽  
Eric Johnson
Keyword(s):  
Real Time ◽  
High Speed ◽  
Time Correction

Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated Circuits

1999 ◽  
Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges
Keyword(s):  
High Resolution ◽  
Integrated Circuits ◽  
Real Time ◽  
High Speed ◽  
Time Signal ◽  
Surface Imaging ◽  
Atomic Force ◽  
Submicron Structures ◽  
High Resolution Images ◽  
Capacitive Loading

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.

Low-Cost High-Speed Techniques for Real-Time Simulation of Power Electronic Systems

2007 ◽  
Author(s):  
R. E. Crosbie ◽  
J. J. Zenor ◽  
R. Bednar ◽  
D. Word ◽  
N. G. Hingorani
Keyword(s):  
Real Time ◽  
High Speed ◽  
Low Cost ◽  
Electronic Systems ◽  
Power Electronic ◽  
Real Time Simulation ◽  
Time Simulation
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