UV laser photolysis of KI: determination of quantum yield fine-structure branching ratio and collisional mixing rates of photofragments

1993 ◽  
Author(s):  
King-Chuen Lin ◽  
C. Ke ◽  
K. Wang
Keyword(s):  
Fine Structure ◽  
Quantum Yield ◽  
Branching Ratio ◽  
Laser Photolysis ◽  
Uv Laser ◽  
Mixing Rates

Direct determination of the quantum yield of hydroxyl radicals in the laser photolysis of formic acid at 222 nm

1987 ◽  
Vol 91 (13) ◽  
pp. 3463-3465 ◽  
Author(s):  
Gurvinder S. Jolly ◽  
Donald L. Singleton ◽  
George. Paraskevopoulos
Keyword(s):  
Quantum Yield ◽  
Formic Acid ◽  
Hydroxyl Radicals ◽  
Direct Determination ◽  
Laser Photolysis

Tunable UV laser photolysis of NF2: Quantum yield for NF(a 1Δ) production

1987 ◽  
Vol 87 (3) ◽  
pp. 1520-1524 ◽  
Author(s):  
R. F. Heidner ◽  
Henry Helvajian ◽  
J. Brooke Koffend
Keyword(s):  
Quantum Yield ◽  
Laser Photolysis ◽  
Uv Laser

Laser photolysis of HNO3 at 222 nm: Direct determination of the primary quantum yield of OH

1986 ◽  
Vol 84 (12) ◽  
pp. 6662-6667 ◽  
Author(s):  
G. S. Jolly ◽  
D. L. Singleton ◽  
D. J. McKenney ◽  
G. Paraskevopoulos
Keyword(s):  
Quantum Yield ◽  
Direct Determination ◽  
Laser Photolysis

ChemInform Abstract: Laser Photolysis of HNO3at 222 nm: Direct Determination of the Primary Quantum Yield of OH.

1986 ◽  
Vol 17 (38) ◽  
Author(s):  
G. S. JOLLY ◽  
D. L. SINGLETON ◽  
D. J. MCKENNEY ◽  
G. PARASKEVOPOULOS
Keyword(s):  
Quantum Yield ◽  
Direct Determination ◽  
Laser Photolysis

ChemInform Abstract: Tunable UV Laser Photolysis of NF2: Quantum Yield for NF(a 1δ) Production.

ChemInform ◽  
1987 ◽  
Vol 18 (43) ◽  
Author(s):  
R. F. III HEIDNER ◽  
H. HELVAJIAN ◽  
J. B. KOFFEND
Keyword(s):  
Quantum Yield ◽  
Laser Photolysis ◽  
Uv Laser

Determination of interface width using EELS fine structure changes

1991 ◽  
Vol 49 ◽  
pp. 730-731
Author(s):  
Vinayak P. Dravid ◽  
M.R. Notis ◽  
C.E. Lyman
Keyword(s):  
Fine Structure ◽  
Materials Science ◽  
Input Parameter ◽  
Core Loss ◽  
Directionally Solidified ◽  
Interface Width ◽  
Structure Changes ◽  
Important Input ◽  
Directionally Solidified Eutectics

The concept of interfacial width is often invoked in many materials science phenomena which relate to the structure and properties of internal interfaces. The numerical value of interface width is an important input parameter in diffusion equations, sintering theories as well as in many electronic devices/processes. Most often, however, this value is guessed rather than determined or even estimated. In this paper we present a method of determining the effective structural and electronic- structural width of interphase interfaces using low- and core loss fine structure effects in EELS spectra.The specimens used in the study were directionally solidified eutectics (DSEs) in the system; NiO-ZrO2(CaO), NiO-Y2O3 and MnO-ZrO2(ss). EELS experiments were carried out using a VG HB-501 FE STEM and a Hitachi HF-2000 FE TEM.

scholarly journals Measurement of the running of the fine structure constant below 1 GeV with the KLOE detector

2019 ◽  
Vol 218 ◽  
pp. 02012
Author(s):  
Graziano Venanzoni
Keyword(s):  
Fine Structure ◽  
Energy Region ◽  
Direct Evidence ◽  
Branching Ratio ◽  
Structure Constant ◽  
Fine Structure Constant ◽  
Recent Measurement ◽  
Single Measurement ◽  
Lepton Universality ◽  
Hadronic Contribution

I will report on the recent measurement of the fine structure constant below 1 GeV with the KLOE detector. It represents the first measurement of the running of α(s) in this energy region. Our results show a more than 5σ significance of the hadronic contribution to the running of α(s), which is the strongest direct evidence both in time-and space-like regions achieved in a single measurement. From a fit of the real part of Δα(s) and assuming the lepton universality the branching ratio BR(ω → µ+µ−) = (6.6 ± 1.4stat ± 1.7syst) · 10−5 has been determined

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