Development of controlling the self-bias voltage and its appraisal by means of estimating ion damages
1991 ◽
Vol 139
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pp. 24-28
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2011 ◽
Vol 02
(09)
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pp. 954-957
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Stress reduction for hard amorphous hydrogenated carbon thin films deposited by the self-bias method
1995 ◽
Vol 270
(1-2)
◽
pp. 220-225
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Keyword(s):
The Self
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