Characterization of Si3N4/SiO2 optical channel waveguides by photon scanning tunneling microscopy

1993 ◽  
Author(s):  
Yan Wang ◽  
Mona H. Chudgar ◽  
Howard E. Jackson ◽  
Jeffrey S. Miller ◽  
Gregory N. De Brabander ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Optical Channel ◽  
Tunneling Microscopy ◽  
Channel Waveguides

Photon scanning tunneling microscopy of optical channel waveguides

1995 ◽  
Vol 57 (2-3) ◽  
pp. 124-129 ◽  
Author(s):  
Ahn Goo Choo ◽  
Mona H. Chudgar ◽  
Howard E. Jackson ◽  
Gregory N. De Brabander ◽  
Mukesh Kumar ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Optical Channel ◽  
Tunneling Microscopy ◽  
Channel Waveguides

Photon Scanning Tunneling Microscopy of Optical Wavegnide Structures

1994 ◽  
Vol 332 ◽  
Author(s):  
Ahn Goo Choo ◽  
Mona H. Chudgar ◽  
Howard E Jackson ◽  
Gregory N. De Brabander ◽  
Mukesh Kumar ◽  
...  
Keyword(s):  
Refractive Index ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Optical Channel ◽  
Refractive Indices ◽  
Tunneling Microscopy ◽  
Model Calculations ◽  
Semiconductor Heterostructure ◽  
Channel Waveguides ◽  
Tapered Optical Fiber

ABSTRACTPhoton scanning tunneling microscopy (PSTM) has been used to obtain effective refractive indices of optical channel waveguide structures. The local evanescent field intensity associated with the propagation modes of optical channel waveguides are measured at two different wavelengths. Both a tapered optical fiber tip and a semiconductor heterostructure tip are employed for detection. Local values of effective refractive index are measured for both TE and TM polarizations and compared to model calculations.

Electronic trap characterization of the Sc2O3∕La2O3 high-κ gate stack by scanning tunneling microscopy

2008 ◽  
Vol 92 (2) ◽  
pp. 022904 ◽  
Author(s):  
Y. C. Ong ◽  
D. S. Ang ◽  
K. L. Pey ◽  
Z. R. Wang ◽  
S. J. O’Shea ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Gate Stack

Manufacturing and Characterization of Nanostructures Using Scanning Tunneling Microscopy with Diamond Tip

2016 ◽  
Vol 42 ◽  
pp. 14-46 ◽  
Author(s):  
Oleg G. Lysenko ◽  
Vladimir I. Grushko ◽  
Sergey N. Dub ◽  
Eugene I. Mitskevich ◽  
Nikolay V. Novikov ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Measuring System ◽  
Scanning Tunneling ◽  
Surface Load ◽  
Tunneling Microscopy ◽  
Electromagnetic Probe ◽  
High Pressure High Temperature ◽  
Single Crystal Diamond ◽  
Selection Of

Nanoscale experiments with diamond tip that include processing, visualization and tunneling spectroscopy of the surface are presented. Single crystal diamond synthesized by the temperature gradient method under high pressure–high temperature (HPHT) conditions is proposed as a multifunctional tip for scanning tunneling microscopy (STM). Sequence of the procedures covering growing crystals with predetermined physical properties, selection of the synthesized crystals with the desired habit and their precise shaping have been developed. The original STM’s peculiarity is the electromagnetic probe-to-surface load measuring system. The results of fabrication and characterization of nanostructures for nanoelectronics, data storages and biology are demonstrated and discussed.

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