Experimental investigation and computer simulation of high-resolution spectra of vibrationally excited SF 6 molecules

1992 ◽  
Author(s):  
Sergey S. Alimpiev ◽  
G. S. Baronov ◽  
D. K. Bronnikov ◽  
A. E. Varfolomeev ◽  
Ivan I. Zasavitskii ◽  
...  
Keyword(s):  
Experimental Investigation ◽  
Computer Simulation ◽  
High Resolution ◽  
Vibrationally Excited

Characterization of Modulated Structure Through Structure Images and their Computer Simulation

1990 ◽  
Vol 48 (1) ◽  
pp. 70-71
Author(s):  
Kiyomichi Nakai ◽  
Yusuke Isobe ◽  
Chiken Kinoshita ◽  
Kazutoshi Shinohara
Keyword(s):  
Computer Simulation ◽  
High Resolution ◽  
Spherical Aberration ◽  
High Resolution Electron Microscopy ◽  
Basic Mechanism ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Transmitted Beam ◽  
Modulated Structure ◽  
Resolution Electron

Induced spinodal decomposition under electron irradiation in a Ni-Au alloy has been investigated with respect to its basic mechanism and confirmed to be caused by the relaxation of coherent strain associated with modulated structure. Modulation of white-dots on structure images of modulated structure due to high-resolution electron microscopy is reduced with irradiation. In this paper the atom arrangement of the modulated structure is confirmed with computer simulation on the structure images, and the relaxation of the coherent strain is concluded to be due to the reduction of phase-modulation.Structure images of three-dimensional modulated structure along <100> were taken with the JEM-4000EX high-resolution electron microscope at the HVEM Laboratory, Kyushu University. The transmitted beam and four 200 reflections with their satellites from the modulated structure in an fee Ni-30.0at%Au alloy under illumination of 400keV electrons were used for the structure images under a condition of the spherical aberration constant of the objective lens, Cs = 1mm, the divergence of the beam, α = 3 × 10-4 rad, underfocus, Δf ≃ -50nm and specimen thickness, t ≃ 15nm. The CIHRTEM code was used for the simulation of the structure image.

Vibrationally Excited Silicon Monoxide Masers

1980 ◽  
Vol 87 ◽  
pp. 537-538
Author(s):  
D. Buhl ◽  
F. O. Clark ◽  
G. Chin ◽  
D. Glenar ◽  
T. Kostiuk ◽  
...  
Keyword(s):  
High Resolution ◽  
Silicon Monoxide ◽  
Published Data ◽  
Vibrationally Excited ◽  
Select Group ◽  
Infrared Measurements ◽  
Apparent Correlation ◽  
Velocity Variations ◽  
Maser Sources

Published data on a select group of SiO maser sources have been analyzed for velocity variations as a function of phase. No apparent correlation was found to a level of about 2 km/s. This places constraints on the location of the maser molecules. Such a correlation should be present at some level. The implications for future high resolution infrared measurements are discussed.

High-resolution x-ray topography of dislocations in 4H-SiC epilayers

2007 ◽  
Vol 22 (4) ◽  
pp. 845-849 ◽  
Author(s):  
Isaho Kamata ◽  
Hidekazu Tsuchida ◽  
William M. Vetter ◽  
Michael Dudley
Keyword(s):  
Computer Simulation ◽  
High Resolution ◽  
Edge Dislocation ◽  
Screw Dislocations ◽  
Burgers Vector ◽  
X Ray ◽  
Topographic Features ◽  
Different Shapes ◽  
Vector Direction ◽  
Simulation Results

Synchrotron x-ray topography with a high-resolution setup using 1128 reflection was carried out on 4H-SiC epilayers. Four different shapes of threading-edge dislocation according to Burgers vector direction were observed. The four types of threading-edge dislocation images were calculated by computer simulation, and the experimental results correlated well with the simulation results. The detailed topographic features generated by plural screw dislocations and basal plane dislocations were also investigated.

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