Automatic visual inspection system for thin film magnetic head wafer using optical enhancement and image processing techniques
2020 ◽
Vol 8
(6)
◽
pp. 5061-5063
1988 ◽
Vol 10
(1)
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pp. 4-16
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2012 ◽
Vol 02
(04)
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pp. 526-528
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1994 ◽
Vol 30
(5)
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pp. 509-518
Keyword(s):
2013 ◽
Vol 70
(23)
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pp. 26-28
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Keyword(s):
2016 ◽
Vol 16
(3)
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pp. 276-290
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2012 ◽
Vol 02
(06)
◽
pp. 1451-1455
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1990 ◽
Vol 48
(1)
◽
pp. 238-239