Representation of homogeneous translucent materials using the P3 approximation and an image-based bidirectional subsurface scattering reflectance distribution function measurement system
Keyword(s):
1977 ◽
Vol 27
(9)
◽
pp. 1027-1033
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Keyword(s):
1980 ◽
Vol 51
(9)
◽
pp. 1159-1162
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