Sub-100-nm-wide slit for detecting ground state atoms with near-field photoionization

2007 ◽  
Vol 1 (1) ◽  
pp. 011560 ◽  
Author(s):  
Tomohiro Sato
Keyword(s):  
Ground State ◽  
Near Field ◽  
Wide Slit

High Sensitive and Spatial-Resolution Atom Sensor Using Two-Step Photoionization with Two-Color Near-Field Lights Generated at a Nano-Slit

2014 ◽  
Vol 605 ◽  
pp. 412-415
Author(s):  
Kenta Sagawa ◽  
Haruhiko Ito
Keyword(s):  
Spatial Resolution ◽  
Time Domain ◽  
Ground State ◽  
Finite Difference Time Domain ◽  
Total Internal Reflection ◽  
Near Field ◽  
Optical Microscope ◽  
Detection Scheme ◽  
Ion Laser ◽  
Difference Time

We develop a nanoslit to detect a small number of neutral atoms in the ground state. The detection scheme of using two-step photoionization is very sensitive and the use of nanometric near-field lights leads to an ultrahigh spatial resolution. An edge-sharpened nanoslit is fabricated with FIB milling. Considering the case of detecting Rb atoms, the polarization-dependent spatial distribution of near-field light generated at the nanoslit by total-internal reflection of a 476.5-nm Ar-ion laser beam is obtained with a scanning near-field optical microscope. Based on the experimental results, the ionization efficiency is estimated for both s-polarization and p-polarization. We also discuss the discrepancy between the experimental value and the numerical one obtained from the finite difference time domain simulations in the p-polarization case.

Local Strain Effects in Near-Field Spectra of Single Semiconductor Quantum Dots.

2002 ◽  
Vol 737 ◽  
Author(s):  
A. M. Mintairov ◽  
P. A. Blagnov ◽  
O. V. Kovalenkov ◽  
C. Li ◽  
J. L. Merz ◽  
...  
Keyword(s):  
Ground State ◽  
Near Field ◽  
Local Strain ◽  
Energy Shift ◽  
High Energy ◽  
Emission Lines ◽  
Strain Component ◽  
Aperture Diameter ◽  
Pressure Coefficients ◽  
Theoretical Investigations

ABSTRACTExperimental and theoretical investigations of high-energy shifts of single InAs, InGaAs, InAlAs and InP quantum dot (QD) emission lines induced by contact pressure exerted by a near-field optical fiber tip are reported. “Pressure” coefficients of 0.65–3.5 meV/nm have been measured for ground state emission lines in agreement with numerical calculations. We show that the observed increase of the tip-induced energy shift with increasing aperture diameter is caused by a decrease of the uniaxial strain component. We also report the effect of emission instability of single QD emission intensity under tip-induced pressure.

Renilla Bioluminescence: A Morphologic Approach to the Location of Photocytes

1974 ◽  
Vol 32 ◽  
pp. 208-209
Author(s):  
Ben O. Spurlock ◽  
Milton J. Cormier
Keyword(s):  
Excited State ◽  
Ground State ◽  
Molecular Basis ◽  
Light Emission ◽  
Chemical Basis ◽  
Electronic Excited State ◽  
Colonial Form ◽  
The Common ◽  
Eighteenth And Nineteenth Centuries ◽  
Catalyzed Oxidation

The phenomenon of bioluminescence has fascinated layman and scientist alike for many centuries. During the eighteenth and nineteenth centuries a number of observations were reported on the physiology of bioluminescence in Renilla, the common sea pansy. More recently biochemists have directed their attention to the molecular basis of luminosity in this colonial form. These studies have centered primarily on defining the chemical basis for bioluminescence and its control. It is now established that bioluminescence in Renilla arises due to the luciferase-catalyzed oxidation of luciferin. This results in the creation of a product (oxyluciferin) in an electronic excited state. The transition of oxyluciferin from its excited state to the ground state leads to light emission.

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Principles of Planar Near-Field Antenna Measurements

2007 ◽  
Author(s):  
Stuart Gregson ◽  
John McCormick ◽  
Clive Parini
Keyword(s):  
Near Field ◽  
Antenna Measurements
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