Novel scheme of packet-level self-synchronization for all-optical packet networks

2006 ◽  
Vol 45 (2) ◽  
pp. 025004
Author(s):  
Min Zhang
Keyword(s):  
Packet Networks ◽  
All Optical

All-optical WDM packet networks

1996 ◽  
Vol 14 (6) ◽  
pp. 1356-1370 ◽  
Author(s):  
S.P. Monacos ◽  
J.M. Morookian ◽  
L. Davis ◽  
L.A. Bergman ◽  
S. Forouhar ◽  
...  
Keyword(s):  
Packet Networks ◽  
Optical Wdm ◽  
All Optical

Hybrid Integrated, All-optical Flip-flop Memory Element for Optical Packet Networks

2006 ◽  
Author(s):  
R. McDougall ◽  
Y. Liu ◽  
G. Maxwell ◽  
M. T. Hill ◽  
R. Harmon ◽  
...  
Keyword(s):  
Packet Networks ◽  
Memory Element ◽  
Flip Flop ◽  
All Optical

A novel self-synchronization scheme for all-optical packet networks

2005 ◽  
Vol 17 (3) ◽  
pp. 645-647 ◽  
Author(s):  
Xuetian Huang ◽  
Peida Ye ◽  
Min Zhang ◽  
Lin Wang
Keyword(s):  
Packet Networks ◽  
All Optical ◽  
Synchronization Scheme

Toward Feasible All-Optical Packet Networks: Recent Results on the WONDER Experimental Testbed

2008 ◽  
Author(s):  
A. Antonino ◽  
V. De Feo ◽  
J. M. Finochietto ◽  
R. Gaudino ◽  
A. La Porta ◽  
...  
Keyword(s):  
Packet Networks ◽  
All Optical ◽  
Experimental Testbed

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

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