Sinusoidal phase modulating laser diode interferometer for on-machine surface profile measurement

2005 ◽  
Vol 44 (12) ◽  
pp. 125602 ◽  
Author(s):  
Xuefeng Zhao
Optik ◽  
2009 ◽  
Vol 120 (11) ◽  
pp. 553-557 ◽  
Author(s):  
He Guotian ◽  
Liao Changrong ◽  
Jiang helun ◽  
Yuangang Lu ◽  
Huang Shanglian

2011 ◽  
Vol 5 (3) ◽  
pp. 369-376 ◽  
Author(s):  
Hiroshi Sawano ◽  
◽  
Motohiro Takahashi ◽  
Hayato Yoshioka ◽  
Hidenori Shinno ◽  
...  

There has been an increasing demand for machining of precision parts recently. In order to meet such requirements, nano-machining systems with on-machine surface profile measuring function are required. This paper presents a newly developed on-machine shape measuring system with an optical probe. In this system, an astigmatic focus error detection method is applied to the optical probe. In addition, the influence of the uneven reflection from the surface can be reduced by using two quadrant photodiodes. The results of surface profile measurement confirm that the system developed provides a resolution of 1 nm scale and a repeatability of approximately 50 nm.


1989 ◽  
Vol 28 (20) ◽  
pp. 4407 ◽  
Author(s):  
Takamasa Suzuki ◽  
Osami Sasaki ◽  
Takeo Maruyama

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