Optical, mechanical and thermal properties of MgF2-ZnS and MgF2-Ta2O5 composite thin films deposited by coevaporation

2000 ◽  
Vol 39 (12) ◽  
pp. 3207 ◽  
Author(s):  
Tae Uk Ryu
Keyword(s):  
Thin Films ◽  
Thermal Properties ◽  
Mechanical And Thermal Properties ◽  
Composite Thin Films

Volatile trinuclear heterometallic beta-diketonates: Structure and thermal properties related to the chemical vapor deposition of composite thin films

Polyhedron ◽  
2020 ◽  
Vol 191 ◽  
pp. 114806
Author(s):  
Vladislav V. Krisyuk ◽  
Samara Urkasym kyzy ◽  
Tatyana V. Rybalova ◽  
Ilya V. Korolkov ◽  
Sergey V. Sysoev ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermal Properties ◽  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Chemical Vapor ◽  
Composite Thin Films

Optical, mechanical and thermal properties of PMMA/graphite nanocomposite thin films

2019 ◽  
Vol 6 (7) ◽  
pp. 075315 ◽  
Author(s):  
Gyanesh Soni ◽  
Purushottam Soni ◽  
Preeti Jangra ◽  
Y K Vijay
Keyword(s):  
Thin Films ◽  
Thermal Properties ◽  
Mechanical And Thermal Properties ◽  
Nanocomposite Thin Films

Atomistically Informed and Dislocation-Based Viscoplasticity Model for Multilayer Composite Thin Films

2019 ◽  
Vol 141 (2) ◽  
Author(s):  
Mohsen Damadam ◽  
Mohammed Anazi ◽  
Georges Ayoub ◽  
Hussein Zbib
Keyword(s):  
Thin Films ◽  
Deformation Behavior ◽  
High Strength ◽  
Multiscale Model ◽  
Md Simulations ◽  
Mechanical And Thermal Properties ◽  
Multilayer Composite ◽  
Composite Thin Films ◽  
Thin Film Composites ◽  
Film Composites

Nano-scale multilayer composite thin films are potential candidates for coating applications at harsh environments due to their promising mechanical and thermal properties. In this study, a viscoplasticity continuum model based on the plastic flow potential of metal/ceramic nanolayer composites, obtained from molecular dynamics (MD) simulations, is developed to build up a multiscale model bridges atomistic simulation with continuum models for the thin film composites. The model adopts a power law hardening considering confined layer slip (CLS) mechanism and accounts for the evolution of dislocation density based on the statistically stored dislocations and geometrically necessary dislocations. It is then implemented into a finite element code (ls-dyna) to investigate the deformation behavior of nanolayer composites at the macroscale. The deformation behavior of a high strength steel coated with Nb/NbC multilayer is also examined.

Structural, Optical and Thermal Properties of PVC/ Polyaniline Composite Thin Films

JOM ◽  
2021 ◽  
Author(s):  
Saloni Sharma ◽  
Kanchan L. Singh ◽  
Mukesh Kumar ◽  
Sangeeta Prasher
Keyword(s):  
Thin Films ◽  
Thermal Properties ◽  
Composite Thin Films

scholarly journals Silicon Nitride and Hydrogenated Silicon Nitride Thin Films: A Review of Fabrication Methods and Applications

Materials ◽  
2021 ◽  
Vol 14 (19) ◽  
pp. 5658
Author(s):  
Nikolett Hegedüs ◽  
Katalin Balázsi ◽  
Csaba Balázsi
Keyword(s):  
Thin Films ◽  
Thermal Properties ◽  
Silicon Nitride ◽  
Vapor Deposition ◽  
Physical Vapor Deposition ◽  
Electron Cyclotron Resonance ◽  
Glass Production ◽  
Mechanical And Thermal Properties ◽  
Potential Candidate ◽  
Hydrogenated Silicon

Silicon nitride (SiNx) and hydrogenated silicon nitride (SiNx:H) thin films enjoy widespread scientific interest across multiple application fields. Exceptional combination of optical, mechanical, and thermal properties allows for their utilization in several industries, from solar and semiconductor to coated glass production. The wide bandgap (~5.2 eV) of thin films allows for its optoelectronic application, while the SiNx layers could act as passivation antireflective layers or as a host matrix for silicon nano-inclusions (Si-ni) for solar cell devices. In addition, high water-impermeability of SiNx makes it a potential candidate for barrier layers of organic light emission diodes (OLEDs). This work presents a review of the state-of-the-art process techniques and applications of SiNx and SiNx:H thin films. We focus on the trends and latest achievements of various deposition processes of recent years. Historically, different kinds of chemical vapor deposition (CVD), such as plasma enhanced (PE-CVD) or hot wire (HW-CVD), as well as electron cyclotron resonance (ECR), are the most common deposition methods, while physical vapor deposition (PVD), which is primarily sputtering, is also widely used. Besides these fabrication methods, atomic layer deposition (ALD) is an emerging technology due to the fact that it is able to control the deposition at the atomic level and provide extremely thin SiNx layers. The application of these three deposition methods is compared, while special attention is paid to the effect of the fabrication method on the properties of SiNx thin films, particularly the optical, mechanical, and thermal properties.

Characterization of Mechanical and Thermal Properties Using Ultrafast Optical Metrology

MRS Bulletin ◽  
2006 ◽  
Vol 31 (8) ◽  
pp. 607-613 ◽  
Author(s):  
G. Andrew Antonelli ◽  
Bernard Perrin ◽  
Brian C. Daly ◽  
David G. Cahill
Keyword(s):  
Thin Films ◽  
Thermal Properties ◽  
Ultrafast Lasers ◽  
Normal Modes ◽  
Picosecond Laser ◽  
Mechanical And Thermal Properties ◽  
Optical Pump ◽  
Ultrafast Optical ◽  
Modes Of Vibration ◽  
Micrometer Scale

AbstractUltrafast lasers have long been used to study the dynamics of fast optical, electronic, and chemical processes in materials. These tools can also be used in a variety of optical pump and probe spectroscopies to generate and detect acoustic signals with frequencies on the order of 100 GHz, and to generate and detect thermal waves with penetration depths on the scale of nanometers. The short wavelengths of these probes make them ideal for the study of the mechanical and thermal properties of thin films, their interfaces, and nanostructures. We describe the picosecond-laser acoustics technique and demonstrate how it can be used to extract the elastic constants and the adhesion of thin films and probe the normal modes of vibration of nanostructures. The thermal properties of thin films are also accessible through time-domain thermoreflectance. Since the mechanical and thermal properties can be obtained quickly on micrometer-scale regions of a sample, spatial mapping of the properties is also possible.

Sign in / Sign up

Export Citation Format

Share Document