Machine learning approach to thickness prediction from in situ spectroscopic ellipsometry data for atomic layer deposition processes
2022 ◽
Vol 40
(1)
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pp. 012405
2021 ◽
Keyword(s):
2019 ◽
Vol 31
(21)
◽
pp. 8937-8947
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Keyword(s):
2021 ◽
Keyword(s):
Keyword(s):
Keyword(s):