Exploration of the nonideal behavior observed in engineered, multilayer MgO/Ag/MgO photocathodes

2021 ◽  
Vol 39 (6) ◽  
pp. 063202
Author(s):  
ZhengRong Lee ◽  
Linda Spentzouris ◽  
Manfred Mascheck ◽  
Jeff Terry
Keyword(s):  
Nonideal Behavior

Uncovering the Basis for Nonideal Behavior of Biological Molecules†

Biochemistry ◽  
2004 ◽  
Vol 43 (45) ◽  
pp. 14472-14484 ◽  
Author(s):  
Jörg Rösgen ◽  
Bernard Montgomery Pettitt ◽  
David Wayne Bolen
Keyword(s):  
Biological Molecules ◽  
Nonideal Behavior

Simulation of nonideal behavior in integrated piezoresistive silicon pressure sensors

1999 ◽  
Author(s):  
Stefan Finkbeiner ◽  
Jochen Franz ◽  
Stefan Hein ◽  
Andreas Junger ◽  
Joerg Muchow ◽  
...  
Keyword(s):  
Pressure Sensors ◽  
Nonideal Behavior

Dielectric Response of Adaptive Piezoelectric Sensoriactuators

2000 ◽  
Author(s):  
Jeffrey S. Vipperman ◽  
Deyu Li
Keyword(s):  
Structural Health Monitoring ◽  
Real Time ◽  
Field Dependence ◽  
Health Monitoring ◽  
Dielectric Response ◽  
Capacitance Measurement ◽  
Structural Health ◽  
Nonideal Behavior

Abstract This paper closely examines the nature of the dielectric response of piezoceramics that are used as Adaptive Piezoelectric Sensoriactuators (APSAs). Firstly, it is demonstrated that he APSA possesses real time structural health monitoring abilities, based on the capacitance measurement of the piezoceramic. Secondly, nonideal behavior including lossy, hysteretic, and field dependence is measured in the piezoceramics and a method mitigating some of this response in the Adaptive Piezoelectric Sensoriactuator is proposed.

scholarly journals On the Implementation of a Dynamic Direction Modulation System with Vector Modulators

2019 ◽  
Vol 2019 ◽  
pp. 1-13 ◽  
Author(s):  
Edith Annette Cabrera-Hernández ◽  
Josep Parron ◽  
Alan Tennant
Keyword(s):  
Wireless Communications ◽  
Physical Layer Security ◽  
Physical Layer ◽  
Efficient Technique ◽  
Synthesis Methods ◽  
System Architectures ◽  
Flexible Framework ◽  
Communications System ◽  
Nonideal Behavior ◽  
Directional Modulation

Dynamic directional modulation (DDM) has already proven to be an efficient technique to achieve physical layer security in wireless communications. System architectures based on vector modulators provide a flexible framework to implement synthesis methods that allow us to obtain increased security and/or independent multichannel transmissions. However, the implementation of DDM with vector modulators requires an accurate calibration (amplitude and phase) of every component in the RF path. In this contribution, we study the sensitivity of the response of a DDM system based on commercial vector modulators showing how to correct the nonideal behavior of all the components thanks to the flexibility provided by the vector modulator.

Correction and curing of in-orbit induced nonideal behavior of ISOPHOTS's photodetectors

1994 ◽  
Author(s):  
Josef Schubert ◽  
Gabriele Roth ◽  
Juergen Wolf ◽  
Dietrich Lemke ◽  
Boris I. Fouks
Keyword(s):  
Nonideal Behavior

Compton Scattering Artifacts in Electron Excited X-Ray Spectra Measured with a Silicon Drift Detector

2011 ◽  
Vol 17 (6) ◽  
pp. 903-910 ◽  
Author(s):  
Nicholas W.M. Ritchie ◽  
Dale E. Newbury ◽  
Abigail P. Lindstrom
Keyword(s):  
Trace Element ◽  
Compton Scattering ◽  
Trace Element Analysis ◽  
X Rays ◽  
Silicon Drift Detector ◽  
Element Analysis ◽  
X Ray ◽  
Peak Absorption ◽  
Small Feature ◽  
Nonideal Behavior

AbstractArtifacts are the nemesis of trace element analysis in electron-excited energy dispersive X-ray spectrometry. Peaks that result from nonideal behavior in the detector or sample can fool even an experienced microanalyst into believing that they have trace amounts of an element that is not present. Many artifacts, such as the Si escape peak, absorption edges, and coincidence peaks, can be traced to the detector. Others, such as secondary fluorescence peaks and scatter peaks, can be traced to the sample. We have identified a new sample-dependent artifact that we attribute to Compton scattering of energetic X-rays generated in a small feature and subsequently scattered from a low atomic number matrix. It seems likely that this artifact has not previously been reported because it only occurs under specific conditions and represents a relatively small signal. However, with the advent of silicon drift detectors and their utility for trace element analysis, we anticipate that more people will observe it and possibly misidentify it. Though small, the artifact is not inconsequential. Under some conditions, it is possible to mistakenly identify the Compton scatter artifact as approximately 1% of an element that is not present.

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