scholarly journals XPS group array analysis of a combinatorial Ni-Ti-Co thin film library

2020 ◽  
Vol 38 (6) ◽  
pp. 063407
Author(s):  
Jonathan D. P. Counsell ◽  
Naila M. Al Hasan ◽  
Edward Walton ◽  
Tieren Gao ◽  
Huilong Hou ◽  
...  
Keyword(s):  
Thin Film ◽  
Array Analysis ◽  
Film Library

scholarly journals Combinatorial Search for New Solar Water Splitting Photoanode Materials in the Thin-Film System Fe–Ti–W–O

2020 ◽  
Vol 234 (5) ◽  
pp. 867-885 ◽  
Author(s):  
Swati Kumari ◽  
Chinmay Khare ◽  
Fanxing Xi ◽  
Mona Nowak ◽  
Kirill Sliozberg ◽  
...  
Keyword(s):  
Thin Film ◽  
Water Splitting ◽  
Spin Coating ◽  
Photocurrent Density ◽  
Coated Sample ◽  
X Ray Diffraction ◽  
Film Library ◽  
X Ray ◽  
Solar Water ◽  
Solar Water Splitting

AbstractIn order to identify new solar water splitting photoanodes, Fe–Ti–W–O materials libraries were fabricated by combinatorial reactive co-sputtering and investigated by high-throughput characterization methods to elucidate compositional, thickness, and structural properties. In addition, photoelectrochemical measurements such as potentiodynamic photocurrent determination and open circuit potential measurements were performed using an automated scanning droplet cell. In the thin-film library, a quaternary photoactive region Fe30–49Ti29–55W13–22Ox was identified as a hit composition region, comprising binary and ternary phases. The identified region shows a distinct surface morphology with larger grains (∼200 nm) being embedded into a matrix of smaller grains (∼80–100 nm). A maximum photocurrent density of 117 μA/cm2 at a bias potential of 1.45 V vs. RHE in NaClO4 as an electrolyte under standard solar simulating conditions was recorded. Additional samples with compositions from the hit region were fabricated by reactive co-sputtering and spin coating followed by annealing. Synchrotron X-ray diffraction of sputtered Fe32Ti52W16Ox thin-films, annealed in air (600 °C, 700 °C, 800 °C) revealed the presence of the phases FeTiO3 and Ti0.54W0.46O2. The composition Fe48Ti30W22Ox from the hit region was fabricated by spin coating and subsequent annealing for a detailed investigation of its structure and photoactivity. After annealing the spin-coated sample at 650 °C for 6 h, X-ray diffraction results showed a dominant pattern with narrow diffraction lines belonging to a distorted FeWO4 (ferberite) phase along with broad diffraction lines addressed as Fe2TiO5 and in a small fraction also, Fe1.7Ti0.23O3. In hematite, Fe can be substituted by Ti, therefore we suggest that in the newfound ferberite-type phase, Ti partially substitutes for Fe leading to a small lattice distortion and a doubling of the monoclinic unit cell. In addition, Na from the substrate stabilizes the new phase: its tentative chemical formula is NaxFe0.33Ti0.67W2O8. A maximum photocurrent density of around 0.43 mA/cm2 at 1.45 V vs. RHE in 1M NaOH (pH ∼ 13.6) as an electrolyte was measured. Different aspects of the dependence of annealing and precursor solution concentration on phase transformation and photoactivity are discussed.

Maximum electrocatalytic oxidation performance for formaldehyde in a combinatorial copper-palladium thin film library

2016 ◽  
Vol 525 ◽  
pp. 110-118 ◽  
Author(s):  
Isabella Pötzelberger ◽  
Cezarina Cela Mardare ◽  
Wolfgang Burgstaller ◽  
Achim Walter Hassel
Keyword(s):  
Thin Film ◽  
Electrocatalytic Oxidation ◽  
Film Library ◽  
Oxidation Performance

scholarly journals Properties of anodic oxides grown on a hafnium–tantalum–titanium thin film library

2014 ◽  
Vol 15 (1) ◽  
pp. 015006 ◽  
Author(s):  
Andrei Ionut Mardare ◽  
Alfred Ludwig ◽  
Alan Savan ◽  
Achim Walter Hassel
Keyword(s):  
Thin Film ◽  
Film Library ◽  
Titanium Thin Film

Novel Crystallization Temperature Measurement Method for Combinatorial Evaluation using Infrared Thermography

2009 ◽  
Vol 1159 ◽  
Author(s):  
Yuko Aono ◽  
Seiichi Hata ◽  
Junpei Sakurai ◽  
Akira Shimokohbe
Keyword(s):  
Thin Film ◽  
Electrical Resistivity ◽  
Amorphous Alloy ◽  
Sample Size ◽  
Infrared Thermography ◽  
Crystallization Temperature ◽  
Resistivity Change ◽  
Combinatorial Method ◽  
Film Library ◽  
Heating Test

AbstractIn combinatorial method, combinatorial evaluation of thin film library has not been established enough, so efficiency of searching by this method is limited. One of property which has not been available combinatorial evaluation is crystallization temperature (Tx). Conventionally, Tx is measured using differential scanning calorimeter (DSC), but it is impossible to apply to the thin film library. Because its one sample size is 1×1 mm, thickness is several micrometers, and 1,089 samples (33columns and 33 rows) are integrated on one library, so the samples are too small to measure using DSC. In this study, an alternative method using infrared thermography is presented for combinatorial evaluation of Tx. This device detects infrared energy radiated from an object and its temperature can be calculated using its own emissivity.In crystallization point, electrical resistivity change is lead with structure change, and this derives emissivity change. Low electrical resistivity means less free electron that is low reflectivity and high emissivity. In heating test, while emissivity keeps constant, T-Ta curve (T: true sample temperature, Ta: apparent temperature measured by thermography) gradient is constant, but the point of Tx, T-Ta curve gradient changes by change of emissivity. Therefore transformation point can be detected by T-Ta curve gradient change. This method can be applied to thin film library, because the method requires only observation of sample surface.PtSi and PdCuSi amorphous alloys were employed to confirm this method. First, homogeneous amorphous alloy thin films were deposited on alumina wafer (20×20mm). Each of these samples was then heated in vacuum chamber with monitoring infrared images and electrical resistivity, in-situ. Obvious emissivity change could be detected at the same temperature of electrical resistivity change. This temperature also agrees enough with DSC results. In case of Pt67Si33, emissivity change was detected at 511K, and DSC result shows Tx at 516K, there is only 5K error between these values. At this temperature, both electrical resistivity and emissivity decreased and it agrees with the theory. Sample crystallization was confirmed after heating test by X-ray diffraction.Measurement on the thin film library was then considered. A quarter thin film library was used, 256 samples (16×16) are integrated and each sample size is 1×1mm separated 0.2mm grid made by sputtering on alumina wafer. For first inspection, all samples were same composition PdCuSi amorphous alloy. Every 3×3 samples, center sample were blank, i.e. alumina surface, its emissivity is stable so the surface indicated reference temperature of around samples. Alumina emissivity was calibrated using a thermo couple on the sample wafer. 184 samples in the all samples were measured at one time, Tx can be detected in all 184 samples and these value errors ranged in 15K. Therefore, this method has a great of potential in combinatorial method.

Recursive Image Charge Approach for Quantitative Characterization of Dielectric Thin Film Library Using Scanning Tip Microwave Near-field Microscopy

2003 ◽  
Vol 804 ◽  
Author(s):  
Chen Gao ◽  
Bo Hu ◽  
Mengming Huang ◽  
Pu Zhang ◽  
Wen-han Liu
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Dielectric Constant ◽  
Near Field ◽  
Image Charge ◽  
Film Library ◽  
Quantitative Characterization ◽  
Dielectric Thin Films ◽  
Dielectric Thin Film

ABSTRACTWe developed a recursive image charge approach for quantitative characterizations of dielectric thin films using the scanning tip microwave near-field microscope. With this method, frequency shift of the microscope as functions of the dielectric constant and the thickness of a film can be effectively computed in a recursive way. We believe that this approach can promote the high-throughput characterization of the dielectric libraries.

scholarly journals Combinatorial Exploration and Mapping of Phase Transformation in a Ni–Ti–Co Thin Film Library

2020 ◽  
Vol 22 (11) ◽  
pp. 641-648
Author(s):  
Naila M. Al Hasan ◽  
Huilong Hou ◽  
Tieren Gao ◽  
Jonathan Counsell ◽  
Suchismita Sarker ◽  
...  
Keyword(s):  
Thin Film ◽  
Phase Transformation ◽  
Film Library
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