Ionic migrations during poling process in lanthanum aluminate investigated by time of flight-secondary ions mass spectrometry and piezoresponse force microscopy combined methodology

2020 ◽  
Vol 38 (3) ◽  
pp. 034002
Author(s):  
Maiglid A. Moreno ◽  
Nicolas Chevalier ◽  
Jean-Paul Barnes ◽  
Brice Gautier
Keyword(s):  
Mass Spectrometry ◽  
Time Of Flight ◽  
Piezoresponse Force Microscopy ◽  
Poling Process ◽  
Force Microscopy ◽  
Lanthanum Aluminate ◽  
Secondary Ions

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part IV: Hexanedioic acid

2017 ◽  
Vol 24 (2) ◽  
pp. 021405
Author(s):  
Gustavo F. Trindade ◽  
Jose M. Ferreira ◽  
Marie-Laure Abel ◽  
Mark A. Baker ◽  
John F. Watts
Keyword(s):  
Mass Spectrometry ◽  
Time Of Flight ◽  
Dicarboxylic Acids ◽  
Secondary Ions ◽  
Hexanedioic Acid

Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part V: Heptanedioic acid

2017 ◽  
Vol 24 (2) ◽  
pp. 021406
Author(s):  
Gustavo F. Trindade ◽  
Jose M. Ferreira ◽  
Marie-Laure Abel ◽  
Mark A. Baker ◽  
John F. Watts
Keyword(s):  
Mass Spectrometry ◽  
Time Of Flight ◽  
Dicarboxylic Acids ◽  
Secondary Ions

Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part III: Pentanedioic acid

2017 ◽  
Vol 24 (2) ◽  
pp. 021404
Author(s):  
Gustavo F. Trindade ◽  
Jose M. Ferreira ◽  
Marie-Laure Abel ◽  
Mark A. Baker ◽  
John F. Watts
Keyword(s):  
Mass Spectrometry ◽  
Time Of Flight ◽  
Dicarboxylic Acids ◽  
Secondary Ions ◽  
Pentanedioic Acid

Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part II: Butanedioic acid

2017 ◽  
Vol 24 (2) ◽  
pp. 021403
Author(s):  
Gustavo F. Trindade ◽  
Jose M. Ferreira ◽  
Marie-Laure Abel ◽  
Mark A. Baker ◽  
John F. Watts
Keyword(s):  
Mass Spectrometry ◽  
Time Of Flight ◽  
Dicarboxylic Acids ◽  
Secondary Ions ◽  
Butanedioic Acid
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