Surface potential of ferroelectric thin films investigated by scanning probe microscopy

1999 ◽  
Vol 17 (5) ◽  
pp. 1930 ◽  
Author(s):  
X. Q. Chen ◽  
H. Yamada ◽  
T. Horiuchi ◽  
K. Matsushige ◽  
S. Watanabe ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Potential ◽  
Scanning Probe Microscopy ◽  
Ferroelectric Thin Films ◽  
Scanning Probe ◽  
Probe Microscopy

The Role of Electrochemical Phenomena in Scanning Probe Microscopy of Ferroelectric Thin Films

ACS Nano ◽  
2011 ◽  
Vol 5 (7) ◽  
pp. 5683-5691 ◽  
Author(s):  
Sergei V. Kalinin ◽  
Stephen Jesse ◽  
Alexander Tselev ◽  
Arthur P. Baddorf ◽  
Nina Balke
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Ferroelectric Thin Films ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Electrochemical Phenomena

Optoeletronic investigation of Cu2ZnSn(S,Se)4 thin-films & Cu2ZnSn(S,Se)4/CdS interface with scanning probe microscopy

2015 ◽  
Vol 59 (2) ◽  
pp. 231-236 ◽  
Author(s):  
Jiangjun Li ◽  
Yugang Zou ◽  
Ting Chen ◽  
Jinsong Hu ◽  
Dong Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

Mapping the surface potential, charge density and adhesion of cellulose nanocrystals using advanced scanning probe microscopy

2020 ◽  
Vol 246 ◽  
pp. 116393 ◽  
Author(s):  
Ankur Goswami ◽  
Kazi M. Alam ◽  
Pawan Kumar ◽  
Piyush Kar ◽  
Thomas Thundat ◽  
...  
Keyword(s):  
Charge Density ◽  
Surface Potential ◽  
Scanning Probe Microscopy ◽  
Cellulose Nanocrystals ◽  
Scanning Probe ◽  
Probe Microscopy

scholarly journals Origin of surface potential in undoped zinc oxide films revealed by advanced scanning probe microscopy techniques

RSC Advances ◽  
2017 ◽  
Vol 7 (67) ◽  
pp. 42393-42397
Author(s):  
Ting Su
Keyword(s):  
Zinc Oxide ◽  
Surface Potential ◽  
Scanning Probe Microscopy ◽  
Oxide Films ◽  
Scanning Probe ◽  
Zno Film ◽  
Probe Microscopy ◽  
Zinc Oxide Films ◽  
Combined Use ◽  
Microscopy Techniques

Surface potential of undoped ZnO film has been studied by a combined use of PFM and KPFM techniques.

Bias assisted scanning probe microscopy direct write lithography enables local oxygen enrichment of lanthanum cuprates thin films

2015 ◽  
Vol 26 (32) ◽  
pp. 325302 ◽  
Author(s):  
Francesco Lavini ◽  
Nan Yang ◽  
Rama K Vasudevan ◽  
E Strelcov ◽  
S Jesse ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Oxygen Enrichment ◽  
Scanning Probe ◽  
Direct Write ◽  
Probe Microscopy ◽  
Local Oxygen
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