Kinetics of Si growth by an electron-beam-irradiation technique using a Si[sub 2]H[sub 6] source

1998 ◽  
Vol 16 (6) ◽  
pp. 3364
Author(s):  
F. Hirose
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Kinetics Of

scholarly journals Kinetic modelling of NO heterogeneous radiation-catalytic oxidation on the TiO2 surface in humid air under the electron beam irradiation

Nukleonika ◽  
2017 ◽  
Vol 62 (3) ◽  
pp. 235-240 ◽  
Author(s):  
Henrietta Nichipor ◽  
Yongxia Sun ◽  
Andrzej G. Chmielewski
Keyword(s):  
Electron Beam ◽  
Catalytic Oxidation ◽  
Removal Efficiency ◽  
Electron Beam Irradiation ◽  
Kinetic Modelling ◽  
Water Concentration ◽  
Beam Irradiation ◽  
Humid Air ◽  
Kinetics Of ◽  
Influential Parameters

Abstract Theoretical study of NOx removal from humid air by a hybrid system (catalyst combined with electron beam) was carried out. The purpose of this work is to study the possibility to decrease energy consumption for NOx removal. The kinetics of radiation catalytic oxidation of NO on the catalyst TiO2 surface under electron beam irradiation was elaborated. Program Scilab 5.3.0 was used for numerical simulations. Influential parameters such as inlet NO concentration, dose, gas fl ow rate, water concentration and catalyst contents that can affect NOx removal efficiency were studied. The results of calculation show that the removal efficiency of NOx might be increased by 8-16% with the presence of a catalyst in the gas irradiated field.

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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