Positive sample bias effect in scanning tunneling microscope imaging of low coverage alkali metal atoms on Si(111)7×7 surface

1998 ◽  
Vol 16 (5) ◽  
pp. 2894 ◽  
Author(s):  
J. Eitle
Keyword(s):  
Alkali Metal ◽  
Scanning Tunneling Microscope ◽  
Positive Sample ◽  
Scanning Tunneling ◽  
Bias Effect ◽  
Tunneling Microscope ◽  
Sample Bias ◽  
Metal Atoms ◽  
Microscope Imaging ◽  
Low Coverage

Scanning-tunneling-microscope imaging of clean and alkali-metal-covered Cu(110) and Au(110) surfaces

1993 ◽  
Vol 48 (3) ◽  
pp. 1738-1749 ◽  
Author(s):  
G. Doyen ◽  
D. Drakova ◽  
J. V. Barth ◽  
R. Schuster ◽  
T. Gritsch ◽  
...  
Keyword(s):  
Alkali Metal ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Microscope Imaging

Direct measurement of forces during scanning tunneling microscope imaging of graphite

1989 ◽  
Vol 208 (3) ◽  
pp. A14
Author(s):  
C. Mathew Mate ◽  
Ragnar Erlandsson ◽  
GaryM. McClelland ◽  
Shirley Chiang
Keyword(s):  
Direct Measurement ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Microscope Imaging

Direct measurement of forces during scanning tunneling microscope imaging of graphite

1989 ◽  
Vol 208 (3) ◽  
pp. 473-486 ◽  
Author(s):  
C.Mathew Mate ◽  
Ragnar Erlandsson ◽  
Gary M. McClelland ◽  
Shirley Chiang
Keyword(s):  
Direct Measurement ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Microscope Imaging
Sign in / Sign up

Export Citation Format

Share Document