Transmission electron microscopy observation of thin foil specimens prepared by means of a focused ion beam

H. Saka

doi:10.1116/1.590202

Transmission electron microscopy observation of thin foil specimens prepared by means of a focused ion beam

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.590202 ◽

1998 ◽

Vol 16 (4) ◽

pp. 2522 ◽

Cited By ~ 27

Author(s):

H. Saka

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Thin Foil ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

Transmission Electron

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Analysis of rolling contact fatigued microstructure using focused ion beam sputtering and transmission electron microscopy observation Muroga, A. and Saka, H. Script Metall. Mater. (1995) 33 (1), 151–156

International Journal of Fatigue ◽

10.1016/s0142-1123(97)87155-1 ◽

1996 ◽

Vol 18 (8) ◽

pp. 609

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron Microscopy Observation ◽

Rolling Contact ◽

Ion Beam Sputtering ◽

Microscopy Observation ◽

Transmission Electron ◽

Beam Sputtering

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Analysis of rolling contact fatigued microstructure using focused ion beam sputtering and transmission electron microscopy observation

Scripta Metallurgica et Materialia ◽

10.1016/0956-716x(95)00108-8 ◽

1995 ◽

Vol 33 (1) ◽

pp. 151-156 ◽

Cited By ~ 26

Author(s):

Akira Muroga ◽

Hiroyasu Saka

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Transmission Electron Microscopy Observation ◽

Rolling Contact ◽

Ion Beam Sputtering ◽

Microscopy Observation ◽

Transmission Electron ◽

Beam Sputtering

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In Situ Transmission Electron Microscopy Observation of Single Crystallization of Filled Aluminum Interconnection

Japanese Journal of Applied Physics ◽

10.1143/jjap.34.l1260 ◽

1995 ◽

Vol 34 (Part 2, No. 10A) ◽

pp. L1260-L1262 ◽

Cited By ~ 3

Author(s):

Jun-ichi Wada ◽

Hiroshi Toyoda ◽

Hisashi Kaneko ◽

Nobuo Hayasaka ◽

Hidehiro Yasuda ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

Transmission Electron

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Transmission Electron Microscopy Observation of Microstructure of Plasma-Sprayed Nanostructured Zirconia Coating

CrossRef Listing of Deleted DOIs ◽

10.1361/105996303772082260 ◽

2003 ◽

Vol 12 (4) ◽

pp. 523-529 ◽

Cited By ~ 5

Author(s):

Huang Chen ◽

Chuanxian Ding

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Observation ◽

Zirconia Coating ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

Transmission Electron ◽

Plasma Sprayed

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Transmission Electron Microscopy Observation of Reaction in Nanometer-scaled Au and Si Binary System

Japanese Journal of Applied Physics ◽

10.1143/jjap.43.850 ◽

2004 ◽

Vol 43 (2) ◽

pp. 850-854

Author(s):

Takashi Ishiguro ◽

Takahiro Shinbo ◽

Junichi Shimanuki

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Binary System ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

Transmission Electron

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Etching technique for transmission electron microscopy observation of nanostructure of visible luminescent porous silicon

Applied Physics Letters ◽

10.1063/1.109673 ◽

1993 ◽

Vol 63 (10) ◽

pp. 1348-1350 ◽

Cited By ~ 13

Author(s):

O. Teschke ◽

M. C. Goncalves ◽

F. Galembeck

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Porous Silicon ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Etching Technique ◽

Electron Microscopy Observation ◽

Transmission Electron

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Transmission electron microscopy observation of the ferroelastic phase transition in LEAD PHOSPHATE (Pb3(PO4)2)

Ecomaterials ◽

10.1016/b978-1-4832-8381-4.50207-9 ◽

1994 ◽

pp. 885-888

Author(s):

S. MORI ◽

N. YAMAMOTO ◽

Y. KOYAMA ◽

Y. UESU ◽

Y. YAMADA

Keyword(s):

Electron Microscopy ◽

Phase Transition ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Lead Phosphate ◽

Electron Microscopy Observation ◽

Ferroelastic Phase Transition ◽

Transmission Electron

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In-Situ Transmission Electron Microscopy Observation of Electromigration in Au Thin Wires

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2012.6813 ◽

2012 ◽

Vol 12 (11) ◽

pp. 8741-8745

Author(s):

Yosuke Murakami ◽

Masashi Arita ◽

Kouichi Hamada ◽

Yasuo Takahashi

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Electron Microscopy Observation ◽

Thin Wires ◽

Transmission Electron

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High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface

Journal of Electron Microscopy ◽

10.1093/jmicro/50.6.541 ◽

2001 ◽

Vol 50 (6) ◽

pp. 541-544 ◽

Cited By ~ 7

Author(s):

J. Liu

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Cross Sectional ◽

Electron Microscopy Observation ◽

Transmission Electron ◽

The Cross ◽

Sectional Structure

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Cross‐sectional transmission electron microscopy observation of Nb/AlOx‐Al/Nb Josephson junctions

Applied Physics Letters ◽

10.1063/1.104556 ◽

1991 ◽

Vol 58 (6) ◽

pp. 645-647 ◽

Cited By ~ 27

Author(s):

Takeshi Imamura ◽

Shinya Hasuo

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Josephson Junctions ◽

Transmission Electron Microscopy Observation ◽

Microscopy Observation ◽

Cross Sectional ◽

Electron Microscopy Observation ◽

Transmission Electron

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