In situ observation of the tip shape of Co–Ge liquid alloy ion sources in a high-voltage transmission electron microscope

1996 ◽  
Vol 14 (3) ◽  
pp. 1621 ◽  
Author(s):  
W. Driesel
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Liquid Alloy ◽  
Ion Sources ◽  
In Situ Observation ◽  
Transmission Electron ◽  
High Voltage Transmission

High-voltage Transmission Electron Microscope in situ Study on Dislocation Motion in Decagonal Al–Ni–Co Single Quasicrystals

2005 ◽  
Vol 20 (7) ◽  
pp. 1814-1824 ◽  
Author(s):  
Martin Bartsch ◽  
Peter Schall ◽  
Michael Feuerbacher ◽  
Ulrich Messerschmidt
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Activation Parameters ◽  
Dislocation Motion ◽  
Transmission Electron ◽  
Macroscopic Deformation ◽  
Icosahedral Quasicrystals ◽  
High Voltage Transmission

Decagonal single quasicrystals of the composition Al70Ni15Co15have been deformed in situ in a high-voltage transmission electron microscope at 730 °C along the 10-fold periodic axis to directly observe the dislocation motion. The deformation is carried by stress-assisted climb of dislocations with periodic Burgers vectors. These dislocations may also glide and move by a combination of glide and climb. Dislocations with Burgers vectors with components in the periodic and quasiperiodic directions probably move under the action of a chemical force. The observations are interpreted by a model established by P. Schall et al. under consideration of the activation parameters of macroscopic deformation and by analogies with the behavior of icosahedral quasicrystals.

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

In situ observation of the motion of ferroelectric domain walls in Bi4Ti3O12 single crystals

2016 ◽  
Vol 49 (5) ◽  
pp. 1645-1652 ◽  
Author(s):  
Wanneng Ye ◽  
Lingli Tang ◽  
Chaojing Lu ◽  
Huabing Li ◽  
Yichun Zhou
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Single Crystals ◽  
Transmission Electron Microscope ◽  
Domain Walls ◽  
Domain Switching ◽  
Ferroelectric Domain ◽  
In Situ Observation ◽  
Transmission Electron

Five types of ferroelectric domain walls (DWs) are present in Bi4Ti3O12 single crystals (Ye et al., 2015). Here their motion was investigated in situ using transmission electron microscopy and optical microscopy. The motion of P (a)-90° DWs, P (a)-180° DWs and P (c)-180° DWs was observed through electron beam poling in a transmission electron microscope. The growth of new P s(a)-180° nanodomains was frequently seen and they tended to nucleate at preexisting P s(a)-90° DWs. Irregularly curved P (c)-180° DWs exhibit the highest mobility, while migration over a short range occurs occasionally for faceted P s(a)-90° DWs. In addition, the motion of P s(a)-90° DWs and the growth/annihilation of new needle-like P s(a)-90° domains in a 20 µm-thick crystal were observed under an external electric field on an optical microscope. Most of the new needle-like P s(a)-90° domains nucleate at preexisting P s(a)-90° DWs and the former are much smaller than the latter. This is very similar to the situation for P s(a)-180° domain switching induced by electron beam poling in a transmission electron microscope. Our observations suggest the energy hierarchy for different domains of P s(c)-180° ≤ P s(a)-180° ≤ P s(a)-90° ≤ new needle-like P s(a)-90° in ferroelectric Bi4Ti3O12.

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