Scanning force microscopy study of the surface topography of thin BaTiO3 films deposited by pulsed laser ablation

1996 ◽  
Vol 14 (3) ◽  
pp. 1600 ◽  
Author(s):  
J. Zhang
Keyword(s):  
Laser Ablation ◽  
Surface Topography ◽  
Pulsed Laser ◽  
Pulsed Laser Ablation ◽  
Scanning Force Microscopy ◽  
Microscopy Study ◽  
Force Microscopy ◽  
Scanning Force

Raman microscopy study of pulsed laser ablation deposited silicon carbide films

1998 ◽  
Vol 332 (1-2) ◽  
pp. 290-294 ◽  
Author(s):  
Fortunato Neri ◽  
Sebastiano Trusso ◽  
Cirino Vasi ◽  
Francesco Barreca ◽  
Paolo Valisa
Keyword(s):  
Silicon Carbide ◽  
Laser Ablation ◽  
Pulsed Laser ◽  
Pulsed Laser Ablation ◽  
Microscopy Study ◽  
Raman Microscopy

A Scanning Force Microscopy Study of Block Copolymers Containing a Conjugated Segment

1997 ◽  
Vol 488 ◽  
Author(s):  
Ph. Leclère ◽  
R. Lazzaroni ◽  
V. Parente ◽  
B. François ◽  
J. L. Brédas
Keyword(s):  
Diblock Copolymers ◽  
Scanning Force Microscopy ◽  
Microscopy Study ◽  
Phase Detection ◽  
Force Microscopy ◽  
Atomic Force ◽  
Molecular Dynamics Calculations ◽  
Chain Composition ◽  
Scanning Force ◽  
Tapping Mode Afm

AbstractAtomic Force Microscopy (AFM) and related techniques are used to investigate the morphology of diblock copolymers. We focus on compounds containing a conjugated segment, polyparaphenylene, associated to a polymethylmethacrylate or a polystyrene block. The influence of the presence of the conjugated segment on the microdomain morphology is analyzed as a function of chain composition. Separate microdomains are observed on the surface of thin films by means of phase-detection imaging tapping-mode AFM. Their shape and size are interpreted in terms of molecular aggregation, with the help of molecular dynamics calculations.

Sign in / Sign up

Export Citation Format

Share Document