Role of interface microstructure in rectifying metal/semiconductor contacts: Ballistic electron emission observations correlated to microstructure

Brent A. Morgan

doi:10.1116/1.588523

Role of interface microstructure in rectifying metal/semiconductor contacts: Ballistic electron emission observations correlated to microstructure

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.588523 ◽

1996 ◽

Vol 14 (2) ◽

pp. 1238 ◽

Cited By ~ 13

Author(s):

Brent A. Morgan

Keyword(s):

Electron Emission ◽

Interface Microstructure ◽

Ballistic Electron ◽

Semiconductor Contacts

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Key role of nanocrystalline feature in porous polycrystalline silicon diodes for efficient ballistic electron emission

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1633772 ◽

2004 ◽

Vol 22 (1) ◽

pp. 57 ◽

Cited By ~ 21

Author(s):

Tsutomu Ichihara ◽

Takashi Hatai ◽

Koichi Aizawa ◽

Takuya Komoda ◽

Akira Kojima ◽

...

Keyword(s):

Electron Emission ◽

Polycrystalline Silicon ◽

Ballistic Electron ◽

Porous Polycrystalline

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Ballistic Electron Emission Microscopy onCoSi2/Si(111)Interfaces: Band Structure Induced Atomic-Scale Resolution and Role of Localized Surface States

Physical Review Letters ◽

10.1103/physrevlett.81.4963 ◽

1998 ◽

Vol 81 (22) ◽

pp. 4963-4966 ◽

Cited By ~ 15

Author(s):

K. Reuter ◽

F. J. Garcia-Vidal ◽

P. L. de Andres ◽

F. Flores ◽

K. Heinz

Keyword(s):

Band Structure ◽

Electron Emission ◽

Surface States ◽

Atomic Scale ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Role of elastic scattering in ballistic-electron-emission microscopy of Au/Si(001) and Au/Si(111) interfaces

Physical Review B ◽

10.1103/physrevb.43.9308 ◽

1991 ◽

Vol 43 (11) ◽

pp. 9308-9311 ◽

Cited By ~ 103

Author(s):

L. J. Schowalter ◽

E. Y. Lee

Keyword(s):

Elastic Scattering ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Annealing effects on the operation stability of ballistic electron emission from electrochemically oxidized nanocrystalline silicon diodes

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1763893 ◽

2004 ◽

Vol 22 (4) ◽

pp. 1784 ◽

Cited By ~ 17

Author(s):

Tsutomu Ichihara ◽

Yoshiaki Honda ◽

Toru Baba ◽

Takuya Komoda ◽

Nobuyoshi Koshida

Keyword(s):

Electron Emission ◽

Nanocrystalline Silicon ◽

Ballistic Electron ◽

Annealing Effects ◽

Operation Stability

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Theory of ballistic electron emission microscopy

Progress in Surface Science ◽

10.1016/s0079-6816(00)00022-8 ◽

2001 ◽

Vol 66 (1-2) ◽

pp. 3-51 ◽

Cited By ~ 37

Author(s):

P.L. de Andres ◽

F.J. Garcia-Vidal ◽

K. Reuter ◽

F. Flores

Keyword(s):

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Ballistic electron emission microscopy investigation of SiGe nanostructures fabricated using reactive-ion etching

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.585939 ◽

1992 ◽

Vol 10 (6) ◽

pp. 3112 ◽

Cited By ~ 8

Author(s):

J. G. Couillard

Keyword(s):

Electron Emission ◽

Reactive Ion Etching ◽

Ballistic Electron Emission Microscopy ◽

Ion Etching ◽

Ballistic Electron ◽

Microscopy Investigation ◽

Emission Microscopy

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Assessing the role of secondary electron emission on the characteristics of 6-cavity magnetrons with transparent cathode through particle-in-cell simulations

Journal of Applied Physics ◽

10.1063/1.4878237 ◽

2014 ◽

Vol 115 (19) ◽

pp. 193303 ◽

Cited By ~ 7

Author(s):

Hao Qiu ◽

Sarita Prasad ◽

Lars Ludeking ◽

Ravi P. Joshi ◽

Edl Schamiloglu

Keyword(s):

Electron Emission ◽

Secondary Electron ◽

Secondary Electron Emission ◽

Particle In Cell

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Ballistic Electron Emission Microscope by Real Space Multiple Scattering Theory

Springer Proceedings in Physics - Multiple Scattering Theory for Spectroscopies ◽

10.1007/978-3-319-73811-6_14 ◽

2018 ◽

pp. 295-300

Author(s):

Keisuke Hatada ◽

Didier Sébilleau

Keyword(s):

Multiple Scattering ◽

Electron Emission ◽

Scattering Theory ◽

Real Space ◽

Multiple Scattering Theory ◽

Ballistic Electron

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Temperature dependence of surface charging of NaCl under electron irradiation: role of secondary electron emission

Applied Surface Science ◽

10.1016/0169-4332(94)00166-9 ◽

1994 ◽

Vol 81 (2) ◽

pp. 215-221 ◽

Cited By ~ 3

Author(s):

W.G. Durrer ◽

M. Portillo ◽

P. Wang ◽

D.P. Russell

Keyword(s):

Temperature Dependence ◽

Electron Irradiation ◽

Electron Emission ◽

Secondary Electron ◽

Secondary Electron Emission ◽

Surface Charging

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Observation of misfit dislocations at the InxGa1−xAs/GaAs interface by ballistic‐electron‐emission microscopy

Applied Physics Letters ◽

10.1063/1.116950 ◽

1996 ◽

Vol 69 (7) ◽

pp. 940-942 ◽

Cited By ~ 11

Author(s):

E. Y. Lee ◽

S. Bhargava ◽

M. A. Chin ◽

V. Narayanamurti ◽

K. J. Pond ◽

...

Keyword(s):

Electron Emission ◽

Misfit Dislocations ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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