Auger electron spectroscopy, x-ray diffraction, and scanning electron microscopy of InN, GaN, and Ga(AsN) films on GaP and GaAs(001) substrates
1995 ◽
Vol 13
(4)
◽
pp. 1585
◽
1990 ◽
Vol 5
(6)
◽
pp. 1169-1175
◽