High resolution x-ray photoemission spectroscopy studies of thin SiO2 and Si/SiO2 interfaces

Author(s):  
Takeo Hattori
2004 ◽  
Vol 272-276 ◽  
pp. E297-E298 ◽  
Author(s):  
T Okane ◽  
S.-i Fujimori ◽  
K Mamiya ◽  
J Okamoto ◽  
Y Muramatsu ◽  
...  

2010 ◽  
Vol 133 (3) ◽  
pp. 034501 ◽  
Author(s):  
Yong Su Kim ◽  
Aaron Bostwick ◽  
Eli Rotenberg ◽  
Philip N. Ross ◽  
Soon Cheol Hong ◽  
...  

1998 ◽  
Vol 5 (3) ◽  
pp. 536-538 ◽  
Author(s):  
Takeshi Nakatani ◽  
Yuji Saitoh ◽  
Yuden Teraoka ◽  
Tetsuo Okane ◽  
Akinari Yokoya

An undulator beamline for spectroscopy studies focusing on the electronic structure of actinide materials is under construction. Linearly or circularly polarized soft X-rays are provided by employing a variably polarizing undulator. Varied-line-spacing plane gratings and a sagittal-focusing system are used to monochromatize the undulator beam, whose energy ranges from 0.3 to 1.5 keV. A resolving power of 104 is expected in the whole energy region. These components are methodically operated by the SPring-8 beamline control system. There are three experimental stations in the beamline. In one of the stations the photoemission spectroscopy experiments are carried out at a radioisotope-controlled area where actinide compounds as well as unsealed radioactive materials are usable. Other experimental stations are planned in the beamline for surface photochemical reactions and biological applications.


2007 ◽  
Author(s):  
Yasutaka Takata ◽  
Koji Horiba ◽  
Masaharu Matsunami ◽  
Shik Shin ◽  
Makina Yabashi ◽  
...  

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