High resolution x-ray photoemission spectroscopy studies of thin SiO2 and Si/SiO2 interfaces
1993 ◽
Vol 11
(4)
◽
pp. 1528
◽
2004 ◽
Vol 16
(48)
◽
pp. S5685-S5688
◽
2004 ◽
Vol 272-276
◽
pp. E297-E298
◽
2010 ◽
Vol 133
(3)
◽
pp. 034501
◽
1998 ◽
Vol 5
(3)
◽
pp. 536-538
◽
1985 ◽
Vol 3
(4)
◽
pp. 1081
◽