Characterization of low energy ion-induced damage using the multiple quantum well probe technique with an intervening superlattice
1993 ◽
Vol 11
(6)
◽
pp. 2249
◽
2009 ◽
Vol 6
(S2)
◽
pp. S711-S714
◽
1997 ◽
Vol 175-176
◽
pp. 983-989
◽
Keyword(s):
2000 ◽
Vol 39
(Part 1, No. 10)
◽
pp. 5781-5787
◽
Keyword(s):
Characterization of nonpolara-plane InGaN/GaN multiple quantum well using double nanopillar SiO2mask
2014 ◽
Vol 53
(5S1)
◽
pp. 05FL01
◽
Keyword(s):
MOCVD growth and characterization of AlGaInN multiple quantum well heterostructures and laser diodes
1999 ◽
Vol 59
(1-3)
◽
pp. 33-38
◽
2001 ◽
Vol 7
(2)
◽
pp. 340-349
◽