Novel method for measuring and analyzing surface roughness on semiconductor laser etched facets
1991 ◽
Vol 9
(6)
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pp. 2778
◽
1993 ◽
Vol 98
(4-6)
◽
pp. 281-284
◽
2017 ◽
Vol 24
(02)
◽
pp. 1750017
◽
Keyword(s):
2013 ◽
Vol 2013
(1)
◽
pp. 000496-000499
Keyword(s):
2017 ◽
Keyword(s):
2015 ◽
Vol 2
(2)
◽
pp. 79-87
◽
1990 ◽
Vol 39
(3)
◽
pp. 458-462
◽