Comparative study of a regular protein layer by scanning tunneling microscopy and transmission electron microscopy

M. Amrein

doi:10.1116/1.585220

Comparative study of a regular protein layer by scanning tunneling microscopy and transmission electron microscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.585220 ◽

1991 ◽

Vol 9 (2) ◽

pp. 1276 ◽

Cited By ~ 22

Author(s):

M. Amrein

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Comparative Study ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Protein Layer ◽

Transmission Electron

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Self-assembled thulium silicide nanostructures on silicon(001) studied by scanning tunneling microscopy and transmission electron microscopy

Journal of Applied Physics ◽

10.1063/1.2896414 ◽

2008 ◽

Vol 103 (6) ◽

pp. 064308 ◽

Cited By ~ 11

Author(s):

J. Zhang ◽

M. A. Crimp ◽

Y. Cui ◽

J. Nogami

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Transmission Electron ◽

Self Assembled

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Use of scanning tunneling microscopy and transmission electron microscopy to quantify and characterize CoSi2 roughness

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.585863 ◽

1992 ◽

Vol 10 (4) ◽

pp. 1329 ◽

Cited By ~ 13

Author(s):

R. C. Chapman

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Transmission Electron

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Scanning tunneling microscopy and transmission electron microscopy studies of Au and Pd clusters grown on a clean graphite surface

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577094 ◽

1990 ◽

Vol 8 (1) ◽

pp. 311-313 ◽

Cited By ~ 30

Author(s):

A. Humbert ◽

M. Dayez ◽

S. Sangay ◽

C. Chapon ◽

C. R. Henry

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Tunneling Microscopy ◽

Graphite Surface ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Transmission Electron ◽

Pd Clusters

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The image potential in scanning transmission electron microscopy and scanning tunneling microscopy

Radiation Effects and Defects in Solids ◽

10.1080/10420159108220608 ◽

1991 ◽

Vol 117 (1-3) ◽

pp. 163-167 ◽

Cited By ~ 5

Author(s):

R. H. Ritchie ◽

P. M. Echenique ◽

F. Flores ◽

J. R. Manson

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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SiO2 / Si Interfaces Studied by Scanning Tunneling Microscopy and High Resolution Transmission Electron Microscopy

Journal of The Electrochemical Society ◽

10.1149/1.2069322 ◽

1992 ◽

Vol 139 (3) ◽

pp. 901-906 ◽

Cited By ~ 7

Author(s):

M. Niwa ◽

M. Matsumoto ◽

H. Iwasaki ◽

M. Onada ◽

R. Sinclair

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Transmission Electron

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ErBa2Cu4O8(001) thin films studied by scanning tunneling microscopy and high resolution transmission electron microscopy

Physica C Superconductivity ◽

10.1016/0921-4534(94)91564-4 ◽

1994 ◽

Vol 235-240 ◽

pp. 681-682

Author(s):

H.P. Lang ◽

R. Sum ◽

N.D. Zakharov ◽

D. Hesse ◽

J.-P. Ramseyer ◽

...

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Transmission Electron

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Transmission electron microscopy observation of a single Ni dot fabricated using scanning tunneling microscopy

International Journal of Precision Engineering and Manufacturing ◽

10.1007/s12541-010-0054-8 ◽

2010 ◽

Vol 11 (3) ◽

pp. 469-472 ◽

Cited By ~ 3

Author(s):

Chul-Un Hong ◽

Hyung-Sub Kang ◽

Seong-Jong Kim ◽

Sung-Jun Kang ◽

Gi-Beum Kim

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Tunneling Microscopy ◽

Transmission Electron Microscopy Observation ◽

Scanning Tunneling ◽

Microscopy Observation ◽

Tunneling Microscopy ◽

Electron Microscopy Observation ◽

Transmission Electron

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Scanning tunneling microscopy and transmission electron microscopy of Langmuir-blodgett films of three donor-sigma-acceptor molecules: BDDAP-C-HETCNQ, BDDAP-C-HPTCNQ and BDDAP-C-HBTCNQ

Synthetic Metals ◽

10.1016/0379-6779(93)90520-7 ◽

1993 ◽

Vol 57 (1) ◽

pp. 3824-3829 ◽

Cited By ~ 8

Author(s):

Ping Wang ◽

James L. Singleton ◽

Xiang-Li Wu ◽

Mohammad Shamsuzzoha ◽

Robert M. Metzger ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Langmuir Blodgett ◽

Transmission Electron ◽

Langmuir Blodgett Films ◽

Acceptor Molecules

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Surface topography and bulk structure of Bi2Sr2CaCu2O8+δ films observed by scanning tunneling microscopy and high-resolution transmission electron microscopy

Physica C Superconductivity ◽

10.1016/0921-4534(95)00109-3 ◽

1995 ◽

Vol 245 (1-2) ◽

pp. 84-92 ◽

Cited By ~ 10

Author(s):

N.D. Zakharov ◽

D. Hesse ◽

F. Nouvertné ◽

J. Auge ◽

H. Hoffschulz ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Scanning Tunneling Microscopy ◽

Surface Topography ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Transmission Electron ◽

Bulk Structure

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Transmission electron microscopy and scanning tunneling microscopy investigations of graphene on 4H-SiC(0001)

Journal of Applied Physics ◽

10.1063/1.3065481 ◽

2009 ◽

Vol 105 (2) ◽

pp. 023503 ◽

Cited By ~ 51

Author(s):

J. Borysiuk ◽

R. Bożek ◽

W. Strupiński ◽

A. Wysmołek ◽

K. Grodecki ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Transmission Electron

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