Compound sputtering cathodes of refractory metal silicides and thin film produced

Author(s):  
Hung-Lee Hoo
Author(s):  
C.K. Wu ◽  
P. Chang ◽  
N. Godinho

Recently, the use of refractory metal silicides as low resistivity, high temperature and high oxidation resistance gate materials in large scale integrated circuits (LSI) has become an important approach in advanced MOS process development (1). This research is a systematic study on the structure and properties of molybdenum silicide thin film and its applicability to high performance LSI fabrication.


2005 ◽  
Vol 66 (2-4) ◽  
pp. 298-302 ◽  
Author(s):  
Hiroyasu Fujiwara ◽  
Yukitomi Ueda ◽  
Alok Awasthi ◽  
Nagaiyar Krishnamurthy ◽  
Sheo Parkash Garg

1997 ◽  
Vol 37 (6) ◽  
pp. 793-800 ◽  
Author(s):  
Mohammad Saqib ◽  
Isaac Weiss

2017 ◽  
Vol 43 (18) ◽  
pp. 16362-16370 ◽  
Author(s):  
Jing-Lian Fan ◽  
Qiong Lu ◽  
Pei-Zhong Feng ◽  
Wei Li

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