Secondary ion mass spectrometry study of silicon surface preparation and the polystyrene/silicon interface

Y. M. Strzhemechny; S. A. Schwarz; J. Schachter; M. H. Rafailovich; J. Sokolov

doi:10.1116/1.580728

Secondary ion mass spectrometry study of silicon surface preparation and the polystyrene/silicon interface

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580728 ◽

1997 ◽

Vol 15 (3) ◽

pp. 894-898 ◽

Cited By ~ 11

Author(s):

Y. M. Strzhemechny ◽

S. A. Schwarz ◽

J. Schachter ◽

M. H. Rafailovich ◽

J. Sokolov

Keyword(s):

Mass Spectrometry ◽

Silicon Surface ◽

Secondary Ion Mass Spectrometry ◽

Surface Preparation ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Silicon Interface ◽

Secondary Ion

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Investigation of surface preparation for diamond deposition on molybdenum substrates by secondary ion mass spectrometry

Diamond and Related Materials ◽

10.1016/0925-9635(93)90258-4 ◽

1993 ◽

Vol 2 (5-7) ◽

pp. 958-962 ◽

Cited By ~ 4

Author(s):

R. Steiner ◽

G. Stingeder ◽

M. Grasserbauer ◽

R. Haubner ◽

B. Lux

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Surface Preparation ◽

Diamond Deposition ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Secondary ion mass spectrometry study of the thermal stability of Cu/refractory metal/Si structures

Journal of Applied Physics ◽

10.1063/1.348973 ◽

1991 ◽

Vol 69 (9) ◽

pp. 6719-6721 ◽

Cited By ~ 24

Author(s):

L. C. Lane ◽

T. C. Nason ◽

G.‐R. Yang ◽

T.‐M. Lu ◽

H. Bakhru

Keyword(s):

Mass Spectrometry ◽

Thermal Stability ◽

Refractory Metal ◽

Secondary Ion Mass Spectrometry ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Thermal Stability Of

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Comment on ?solute carbon and carbon segregation in magnesium oxide single crystals ? A secondary ion mass spectrometry study? by F. Freund

Physics and Chemistry of Minerals ◽

10.1007/bf00308279 ◽

1986 ◽

Vol 13 (4) ◽

pp. 277-279 ◽

Cited By ~ 11

Author(s):

I. S. T. Tsong ◽

U. Knipping

Keyword(s):

Mass Spectrometry ◽

Single Crystals ◽

Magnesium Oxide ◽

Secondary Ion Mass Spectrometry ◽

Carbon Segregation ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Solute Carbon ◽

Secondary Ion

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Static secondary ion mass spectrometry study of the decomposition of triethylgallium on GaAs (100)

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580856 ◽

1997 ◽

Vol 15 (6) ◽

pp. 3127-3133 ◽

Cited By ~ 11

Author(s):

K. C. Wong ◽

M. S. Jackson ◽

M. T. McEllistrem ◽

R. D. Culp ◽

J. G. Ekerdt

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Aluminas modified with silica. Part 1.—An X-ray diffraction and secondary-ion mass-spectrometry study of the influence of preparation and thermal treatment on structure and surface composition

Journal of the Chemical Society Faraday Transactions 1 Physical Chemistry in Condensed Phases ◽

10.1039/f19848001903 ◽

1984 ◽

Vol 80 (7) ◽

pp. 1903 ◽

Cited By ~ 9

Author(s):

Alan W. Espie ◽

John C. Vickerman

Keyword(s):

Mass Spectrometry ◽

Thermal Treatment ◽

Secondary Ion Mass Spectrometry ◽

Surface Composition ◽

X Ray Diffraction ◽

X Ray ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Time-of-flight secondary ion mass spectrometry study of lithium intercalation process in LiCoO2 thin film

Journal of Power Sources ◽

10.1016/j.jpowsour.2016.04.084 ◽

2016 ◽

Vol 321 ◽

pp. 241-247 ◽

Cited By ~ 10

Author(s):

C. Dellen ◽

H.-G. Gehrke ◽

S. Möller ◽

C.-L. Tsai ◽

U. Breuer ◽

...

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Lithium Intercalation ◽

Intercalation Process ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Time‐of‐flight secondary ion mass spectrometry study of P2S5/(NH4)2S‐ and ultraviolet/ozone‐treated GaAs

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578612 ◽

1993 ◽

Vol 11 (5) ◽

pp. 2597-2602 ◽

Cited By ~ 4

Author(s):

J. Bennett ◽

J. A. Dagata

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Time-of-flight static secondary ion mass spectrometry study of imidization in pyromellitic dianhydride-4,4'-oxydianiline polyimide films

Macromolecules ◽

10.1021/ma00011a026 ◽

1991 ◽

Vol 24 (11) ◽

pp. 3209-3214 ◽

Cited By ~ 3

Author(s):

B. N. Eldridge ◽

C. Feger ◽

M. J. Goldberg ◽

W. Reuter ◽

G. J. Scilla

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Pyromellitic Dianhydride ◽

Polyimide Films ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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The solid solubility of Fe in α-Zr: A secondary ion mass spectrometry study

Journal of Nuclear Materials ◽

10.1016/0022-3115(94)90177-5 ◽

1994 ◽

Vol 210 (3) ◽

pp. 239-243 ◽

Cited By ~ 39

Author(s):

H. Zou ◽

G.M. Hood ◽

J.A. Roy ◽

R.J. Schultz ◽

J.A. Jackman

Keyword(s):

Mass Spectrometry ◽

Solid Solubility ◽

Secondary Ion Mass Spectrometry ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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A secondary‐ion‐mass spectrometry study of magnesium diffusion in lithium niobate

Journal of Applied Physics ◽

10.1063/1.357988 ◽

1994 ◽

Vol 76 (11) ◽

pp. 7552-7558 ◽

Cited By ~ 16

Author(s):

F. Caccavale ◽

P. Chakraborty ◽

I. Mansour ◽

G. Gianello ◽

M. Mazzoleni ◽

...

Keyword(s):

Mass Spectrometry ◽

Lithium Niobate ◽

Secondary Ion Mass Spectrometry ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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