Metal pattern fabrication using the local electric field of a conducting atomic force microscope probe

1997 ◽  
Vol 15 (3) ◽  
pp. 1455-1459 ◽  
Author(s):  
Susan L. Brandow ◽  
Jeffrey M. Calvert ◽  
Eric S. Snow ◽  
Paul M. Campbell
Keyword(s):  
Electric Field ◽  
Atomic Force Microscope ◽  
Local Electric Field ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Metal Pattern ◽  
Microscope Probe

Nanolocalized charge writing in thin SiO2 layers with embedded silicon nanocrystals under an atomic force microscope probe

2007 ◽  
Vol 33 (10) ◽  
pp. 889-892 ◽  
Author(s):  
M. S. Dunaevskii ◽  
A. N. Titkov ◽  
S. Yu. Larkin ◽  
A. B. Speshilova ◽  
S. E. Aleksandrov ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Silicon Nanocrystals ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Microscope Probe

scholarly journals A local field emission study of partially aligned carbon-nanotubes by atomic force microscope probe

Carbon ◽  
2007 ◽  
Vol 45 (15) ◽  
pp. 2957-2971 ◽  
Author(s):  
A. Di Bartolomeo ◽  
A. Scarfato ◽  
F. Giubileo ◽  
F. Bobba ◽  
M. Biasiucci ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Local Field ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Aligned Carbon Nanotubes ◽  
Emission Study ◽  
Microscope Probe

5513 Development of 4 point probe with an atomic force microscope probe function

2006 ◽  
Vol 2006.7 (0) ◽  
pp. 311-312
Author(s):  
Masafumi Takahashi ◽  
Kenjiro Ayano ◽  
Gen Hashiguchi ◽  
Takashi Yokokawa ◽  
Hiroyuki Fujita
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Microscope Probe

Imaging bandwidth of the tapping mode atomic force microscope probe

2006 ◽  
Vol 73 (15) ◽  
Author(s):  
János Kokavecz ◽  
Othmar Marti ◽  
Péter Heszler ◽  
Ádám Mechler
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force Microscope Probe ◽  
Tapping Mode ◽  
Atomic Force ◽  
Microscope Probe
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