Silicon surfaces treated by CF4, CF4/H2, and CF4/O2 rf plasmas: Study by in situ Fourier transform infrared ellipsometry

1997 ◽  
Vol 15 (2) ◽  
pp. 209-215 ◽  
Author(s):  
Tatsuru Shirafuji ◽  
Winfred W. Stoffels ◽  
Hiroshi Moriguchi ◽  
Kunihide Tachibana
2021 ◽  
Vol 11 (6) ◽  
pp. 2021-2025
Author(s):  
Liujin Wei ◽  
Guan Huang ◽  
Yajun Zhang

The combination of time-resolved transient photoluminescence with in-situ Fourier transform infrared spectroscopy has been conducted to investigate the intrinsic phase structure-dependent activity of Bi2O3 catalyst for CO2 reduction.


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