X-ray absorption and Auger electron spectroscopy studies of the quality of diamond thin films grown by the oxy-acetylene flame method

A. Gutiérrez; M. F. López; I. García; A. Vázquez

doi:10.1116/1.580483

X-ray absorption and Auger electron spectroscopy studies of the quality of diamond thin films grown by the oxy-acetylene flame method

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580483 ◽

1997 ◽

Vol 15 (2) ◽

pp. 294-297 ◽

Cited By ~ 23

Author(s):

A. Gutiérrez ◽

M. F. López ◽

I. García ◽

A. Vázquez

Keyword(s):

Thin Films ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Diamond Thin Films ◽

Flame Method ◽

Spectroscopy Studies ◽

X Ray Absorption

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A correlation of Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and Rutherford backscattering spectrometry measurements on sputter‐deposited titanium nitride thin films

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574092 ◽

1986 ◽

Vol 4 (6) ◽

pp. 2463-2469 ◽

Cited By ~ 104

Author(s):

Brad J. Burrow ◽

Alan E. Morgan ◽

Russell C. Ellwanger

Keyword(s):

Thin Films ◽

Titanium Nitride ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

X Ray ◽

Sputter Deposited

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Analysis of Surfaces and Thin Films by Using Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Journal of the Korean Physical Society ◽

10.3938/jkps.51.925 ◽

2007 ◽

Vol 51 (3) ◽

pp. 925 ◽

Cited By ~ 3

Author(s):

John T. Grant

Keyword(s):

Thin Films ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and electron energy‐loss spectroscopy studies of MoSi2

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577917 ◽

1992 ◽

Vol 10 (4) ◽

pp. 2822-2825 ◽

Cited By ~ 11

Author(s):

R. S. Rastogi ◽

V. D. Vankar ◽

K. L. Chopra

Keyword(s):

Energy Loss ◽

Auger Electron Spectroscopy ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Spectroscopy Studies ◽

Electron Energy Loss

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Nonlinear composition dependence of x-ray photoelectron spectroscopy and Auger electron spectroscopy features in plasma-deposited zirconium silicate alloy thin films

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1493788 ◽

2002 ◽

Vol 20 (4) ◽

pp. 1748 ◽

Cited By ~ 88

Author(s):

G. B. Rayner ◽

D. Kang ◽

Y. Zhang ◽

G. Lucovsky

Keyword(s):

Thin Films ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Composition Dependence ◽

X Ray ◽

Zirconium Silicate

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Auger electron spectroscopy/x‐ray photoelectron spectroscopy study of Ti–B–N thin films

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.579743 ◽

1995 ◽

Vol 13 (3) ◽

pp. 1633-1638 ◽

Cited By ~ 18

Author(s):

M. A. Baker ◽

A. Steiner ◽

J. Haupt ◽

W. Gissler

Keyword(s):

Thin Films ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Spectroscopy Study ◽

X Ray

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Combined x-ray photoelectron/Auger electron spectroscopy/glancing angle x-ray diffraction/extended x-ray absorption fine structure investigation of TiBxNy coatings

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580526 ◽

1997 ◽

Vol 15 (2) ◽

pp. 284-291 ◽

Cited By ~ 46

Author(s):

M. A. Baker ◽

T. P. Mollart ◽

P. N. Gibson ◽

W. Gissler

Keyword(s):

Fine Structure ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Structure Investigation ◽

X Ray Diffraction ◽

X Ray ◽

Absorption Fine ◽

Glancing Angle ◽

X Ray Absorption

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X‐ray photoelectron spectroscopy and Auger electron spectroscopy studies of ferroelectric (Pb,La)TiO3thin films prepared by a multi‐ion‐beam reactive cosputtering technique

Journal of Applied Physics ◽

10.1063/1.354149 ◽

1993 ◽

Vol 74 (1) ◽

pp. 224-227 ◽

Cited By ~ 49

Author(s):

Zhenghong Qian ◽

Dingquan Xiao ◽

Jianguo Zhu ◽

Zisheng Li ◽

Changming Zuo

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Beam ◽

X Ray ◽

Spectroscopy Studies

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X-Ray photo- and resonant Auger-electron spectroscopy studies of liquid water and aqueous solutions

Annual Reports Section C (Physical Chemistry) ◽

10.1039/b803023p ◽

2009 ◽

Vol 105 ◽

pp. 174 ◽

Cited By ~ 35

Author(s):

Matthew A. Brown ◽

Manfred Faubel ◽

Bernd Winter

Keyword(s):

Aqueous Solutions ◽

Auger Electron Spectroscopy ◽

Liquid Water ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Spectroscopy Studies

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X-Ray Absorption, Photoemission, and Auger Electron Spectroscopy: Electronic Structure and Growth of Metal/Metal Interfaces

Materials Science Forum ◽

10.4028/www.scientific.net/msf.59-60.161 ◽

1991 ◽

Vol 59-60 ◽

pp. 161-228

Author(s):

B. Carrière ◽

G. Krill

Keyword(s):

Electronic Structure ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Metal Metal ◽

Metal Interfaces ◽

X Ray Absorption

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Auger electron spectroscopy and x‐ray photoelectron spectroscopy studies of adhesion failure of Ni/Au‐plated contacts in ceramic electronic packages

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.579952 ◽

1996 ◽

Vol 14 (3) ◽

pp. 1348-1351 ◽

Cited By ~ 2

Author(s):

D. N. Braski ◽

E. D. Winters

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Electronic Packages ◽

X Ray ◽

Adhesion Failure ◽

Spectroscopy Studies

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