Approximate method for reducing the effect of beam misalignment on low‐energy electron diffraction I(E) curves at the normal incidence: The horizontal‐beam method

1994 ◽  
Vol 12 (2) ◽  
pp. 471-475 ◽  
Author(s):  
Seigi Mizuno ◽  
Hiroshi Tochihara ◽  
Takaaki Kawamura
Keyword(s):  
Electron Diffraction ◽  
Approximate Method ◽  
Normal Incidence ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron Diffraction ◽  
Horizontal Beam ◽  
Beam Method ◽  
Low Energy Electron

Mirror Electron Microscope-Low Energy Electron Diffraction for Studies of Surface Ordering and Melting

1990 ◽  
Vol 208 ◽  
Author(s):  
W. N. Unertl ◽  
C. S. Shern
Keyword(s):  
Electron Diffraction ◽  
Surface Potential ◽  
High Vacuum ◽  
Normal Incidence ◽  
Low Energy ◽  
Energy Electron ◽  
Ultra High Vacuum ◽  
Objective Lens ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron

ABSTRACTMirror Electron Microscopy – Low Energy Electron Diffraction (MEMLEED) combines a LEED with MEM in a single simple instrument for studies of surface processes such as phase transitions and premelting under ultra-high vacuum (uhv) conditions. In MEMLEED, 5–20 keV primary electrons are decelerated by an electrostatic mirror-objective lens in which the sample is the mirror element. In the MEN mode, electrons are reflected just above the surface, reaccelerated through the objective lens and imaged. Contrast is due to variations in both surface potential and topography. Current uhv instruments have lateral resolution of about 1 μm. In the LEED mode, 0-100 eV electrons strike the sample at near normal incidence. Diffracted electrons are accelerated through the objective lens. Beam spacings in the imaged diffraction pattern are proportional to k11 and beams do not move as the incident energy is varied. MEMLEED has intrinsically higher transfer width and is less sensitive to magnetic fields near the sample than conventional LEED. Design considerations for uhv instruments are discussed. Applications to the study of order-disorder transitions, premelting phenomena, and to measurements of changes in surface potential are described.

Inclusion of off-normal incidence data in a low-energy electron diffraction crystallographic analysis for the Cu(100)-(2 × 2)-S surface structure

1990 ◽  
Vol 68 (4-5) ◽  
pp. 353-356 ◽  
Author(s):  
H. C. Zeng ◽  
R. A. McFarlane ◽  
K. A. R. Mitchell
Keyword(s):  
Electron Diffraction ◽  
Surface Structure ◽  
Polar Angle ◽  
Normal Incidence ◽  
Crystallographic Analysis ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron ◽  
Cu Interlayer

A low-energy electron diffraction (LEED) crystallographic analysis has been undertaken to assess the lateral and vertical relaxations for the Cu(100)-(2 × 2)-S surface structure. The study uses five normal-incidence beams and seven beams with an off-normal direction for a polar angle of incidence equal to 8°. Both lateral and vertical relaxations in the copper structure are small (0.03 Å or less) compared with the structure in bulk copper, but the senses are unchanged from the recent normal-incidence analysis (H. C. Zeng, R. A. McFarlane, and K. A. R. Mitchell, Phys. Rev. B, 39, 8000 (1989)). The new LEED-determined S—Cu bond length is 2.23 ± 0.06 Å, while the S to topmost Cu interlayer spacing is 1.28 ± 0.03 Å.

Low-Energy-Electron-Diffraction Structural Studies of (100) Cleavage Surfaces of In4Se3 Layered Crystals

2014 ◽  
Vol 59 (6) ◽  
pp. 612-621 ◽  
Author(s):  
P.V. Galiy ◽  
◽  
Ya.B. Losovyj ◽  
T.M. Nenchuk ◽  
I.R. Yarovets’ ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Low Energy ◽  
Energy Electron ◽  
Structural Studies ◽  
Low Energy Electron Diffraction ◽  
Layered Crystals ◽  
Low Energy Electron

The role of an energy-dependent inner potential in quantitative low-energy electron diffraction

2000 ◽  
Vol 458 (1-3) ◽  
pp. 155-161 ◽  
Author(s):  
S Walter ◽  
V Blum ◽  
L Hammer ◽  
S Müller ◽  
K Heinz ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron ◽  
Energy Dependent

scholarly journals Low-energy-electron-diffraction fine structure in W(001) for energies from 0 to 35 eV

1985 ◽  
Vol 32 (10) ◽  
pp. 6131-6137 ◽  
Author(s):  
J.-M. Baribeau ◽  
J.-D. Carette ◽  
P. J. Jennings ◽  
R. O. Jones
Keyword(s):  
Fine Structure ◽  
Electron Diffraction ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron
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