Si/SiO2 interface studies by spectroscopic immersion ellipsometry and atomic force microscopy
1994 ◽
Vol 12
(5)
◽
pp. 2625-2629
◽
1997 ◽
Vol 222
(1-2)
◽
pp. 69-82
◽
2020 ◽
2019 ◽
Vol 139
(11)
◽
pp. 756-759
2000 ◽
Vol 10
(1-2)
◽
pp. 15
2020 ◽