Ordered Hg0.8Cd0.2Te (111)A and (111)B surfaces: Preparation by annealing in Hg vapor and characterization by low‐energy electron diffraction, Auger electron spectroscopy, and electron energy‐loss spectroscopy

John Y. Gui; Donald A. Stern; Arthur T. Hubbard

doi:10.1116/1.578124

Ordered Hg0.8Cd0.2Te (111)A and (111)B surfaces: Preparation by annealing in Hg vapor and characterization by low‐energy electron diffraction, Auger electron spectroscopy, and electron energy‐loss spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578124 ◽

1992 ◽

Vol 10 (1) ◽

pp. 122-130 ◽

Cited By ~ 3

Author(s):

John Y. Gui ◽

Donald A. Stern ◽

Arthur T. Hubbard

Keyword(s):

Electron Diffraction ◽

Energy Loss ◽

Auger Electron Spectroscopy ◽

Electron Energy Loss Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Electron Energy Loss

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Summary Abstract: Low‐energy electron diffraction, Auger electron spectroscopy, and electron energy‐loss spectroscopy studies of (511) and (711) GaAs surfaces

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574664 ◽

1987 ◽

Vol 5 (4) ◽

pp. 654-655 ◽

Cited By ~ 2

Author(s):

K. Young ◽

A. Kahn

Keyword(s):

Electron Diffraction ◽

Energy Loss ◽

Electron Energy Loss Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies ◽

Electron Energy Loss

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The β‐SiC(100) surface studied by low energy electron diffraction, Auger electron spectroscopy, and electron energy loss spectra

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.573495 ◽

1986 ◽

Vol 4 (1) ◽

pp. 38-45 ◽

Cited By ~ 108

Author(s):

Moshe Dayan

Keyword(s):

Electron Diffraction ◽

Energy Loss ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Electron Energy Loss ◽

Electron Energy Loss Spectra

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Auger electron spectroscopy–electron energy‐loss spectroscopy–low‐energy electron diffraction study of a V6C5(100) surface

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574307 ◽

1987 ◽

Vol 5 (4) ◽

pp. 985-988 ◽

Cited By ~ 4

Author(s):

S. Usami ◽

H. Nakai ◽

T. Yaguchi ◽

Y. Kumashiro ◽

A. Fujimori

Keyword(s):

Electron Diffraction ◽

Energy Loss ◽

Electron Energy Loss Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Electron Diffraction Study ◽

Low Energy ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Electron Energy Loss

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Auger electron spectroscopy, low energy electron diffraction and electron energy loss spectroscopy studies of Se overlayers grown on Cu(111) surfaces

Thin Solid Films ◽

10.1016/0040-6090(93)90565-7 ◽

1993 ◽

Vol 228 (1-2) ◽

pp. 64-67 ◽

Cited By ~ 6

Author(s):

Seiichi Nagashima ◽

Iwao Ogura

Keyword(s):

Electron Diffraction ◽

Energy Loss ◽

Electron Energy Loss Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies ◽

Electron Energy Loss

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Potential-dependent surface chemistry of hydroxypyridines adsorbed at a platinum(III) electrode studied by electron energy loss spectroscopy, low-energy electron diffraction, Auger electron spectroscopy, and electrochemistry

Langmuir ◽

10.1021/la00060a044 ◽

1991 ◽

Vol 7 (12) ◽

pp. 3183-3189 ◽

Cited By ~ 3

Author(s):

John Y. Gui ◽

Donald A. Stern ◽

Chiu Hsun. Lin ◽

Ping. Gao ◽

Arthur T. Hubbard

Keyword(s):

Electron Diffraction ◽

Energy Loss ◽

Surface Chemistry ◽

Electron Energy Loss Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Electron Energy Loss

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Electron energy loss spectroscopy, low energy electron diffraction, and auger electron spectroscopy study of Indium overlayers on Si(111) and Si(100) surfaces

Thin Solid Films ◽

10.1016/j.tsf.2005.05.029 ◽

2005 ◽

Vol 489 (1-2) ◽

pp. 111-115 ◽

Cited By ~ 3

Author(s):

Manhui Sun ◽

Chuan Hu ◽

R.G. Zhao ◽

Hang Ji

Keyword(s):

Electron Diffraction ◽

Energy Loss ◽

Electron Energy Loss Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Spectroscopy Study ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Electron Energy Loss

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Oxidation of the Si(111) (7×7) surface: Electron energy loss spectroscopy, low‐energy electron diffraction, and Auger electron spectroscopy studies

The Journal of Chemical Physics ◽

10.1063/1.449787 ◽

1985 ◽

Vol 83 (1) ◽

pp. 428-436 ◽

Cited By ~ 72

Author(s):

K. Edamoto ◽

Y. Kubota ◽

H. Kobayashi ◽

M. Onchi ◽

M. Nishijima

Keyword(s):

Electron Diffraction ◽

Energy Loss ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Surface Electron ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Spectroscopy Studies ◽

Electron Energy Loss

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Ultraviolet photoelectron spectroscopy, Auger electron spectroscopy, low-energy electron diffraction and flash-desorption studies of the chemisorption and decomposition of H2S and H2O on W(100)

Journal of the Chemical Society Faraday Transactions 1 Physical Chemistry in Condensed Phases ◽

10.1039/f19817702223 ◽

1981 ◽

Vol 77 (9) ◽

pp. 2223 ◽

Cited By ~ 24

Author(s):

Ashok K. Bhattacharya ◽

Lionel J. Clarke ◽

Leonardo Morales de la Garza

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Ultraviolet Photoelectron Spectroscopy ◽

Low Energy Electron Diffraction ◽

Low Energy Electron ◽

Flash Desorption

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Direct observation of LaB6(001) surface at high temperatures by x‐ray and ultraviolet photoelectron spectroscopy, low‐energy electron diffraction, Auger electron spectroscopy, and work‐function measurements

Journal of Applied Physics ◽

10.1063/1.326542 ◽

1979 ◽

Vol 50 (7) ◽

pp. 4802-4807 ◽

Cited By ~ 28

Author(s):

M. Aono ◽

R. Nishitani ◽

C. Oshima ◽

T. Tanaka ◽

E. Bannai ◽

...

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Ultraviolet Photoelectron Spectroscopy ◽

X Ray ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Surface structures of the Mg/Si(100) system studied by low-energy electron diffraction and Auger electron spectroscopy

Surface Science ◽

10.1016/0039-6028(94)90579-7 ◽

1994 ◽

Vol 319 (1-2) ◽

pp. 165-171 ◽

Cited By ~ 17

Author(s):

Y. Kawashima ◽

H. Tanabe ◽

T. Ikeda ◽

H. Itoh ◽

T. Ichinokawa

Keyword(s):

Electron Diffraction ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Low Energy ◽

Energy Electron ◽

Surface Structures ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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